Paper ID: 2311.17894

Learning and Controlling Silicon Dopant Transitions in Graphene using Scanning Transmission Electron Microscopy

Max Schwarzer, Jesse Farebrother, Joshua Greaves, Ekin Dogus Cubuk, Rishabh Agarwal, Aaron Courville, Marc G. Bellemare, Sergei Kalinin, Igor Mordatch, Pablo Samuel Castro, Kevin M. Roccapriore

We introduce a machine learning approach to determine the transition dynamics of silicon atoms on a single layer of carbon atoms, when stimulated by the electron beam of a scanning transmission electron microscope (STEM). Our method is data-centric, leveraging data collected on a STEM. The data samples are processed and filtered to produce symbolic representations, which we use to train a neural network to predict transition probabilities. These learned transition dynamics are then leveraged to guide a single silicon atom throughout the lattice to pre-determined target destinations. We present empirical analyses that demonstrate the efficacy and generality of our approach.

Submitted: Nov 21, 2023