Paper ID: 2411.06363

Layer-Wise Feature Metric of Semantic-Pixel Matching for Few-Shot Learning

Hao Tang, Junhao Lu, Guoheng Huang, Ming Li, Xuhang Chen, Guo Zhong, Zhengguang Tan, Zinuo Li

In Few-Shot Learning (FSL), traditional metric-based approaches often rely on global metrics to compute similarity. However, in natural scenes, the spatial arrangement of key instances is often inconsistent across images. This spatial misalignment can result in mismatched semantic pixels, leading to inaccurate similarity measurements. To address this issue, we propose a novel method called the Layer-Wise Features Metric of Semantic-Pixel Matching (LWFM-SPM) to make finer comparisons. Our method enhances model performance through two key modules: (1) the Layer-Wise Embedding (LWE) Module, which refines the cross-correlation of image pairs to generate well-focused feature maps for each layer; (2)the Semantic-Pixel Matching (SPM) Module, which aligns critical pixels based on semantic embeddings using an assignment algorithm. We conducted extensive experiments to evaluate our method on four widely used few-shot classification benchmarks: miniImageNet, tieredImageNet, CUB-200-2011, and CIFAR-FS. The results indicate that LWFM-SPM achieves competitive performance across these benchmarks. Our code will be publicly available on this https URL

Submitted: Nov 10, 2024