ATPG Algorithm

Automatic Test Pattern Generation (ATPG) algorithms aim to efficiently create test vectors for detecting faults in integrated circuits. Recent research focuses on improving both the speed and coverage of these algorithms, exploring hybrid approaches that combine structural methods with machine learning models like neural networks and support vector machines to predict optimal input values. These advancements address the increasing complexity of modern circuits, leading to faster and more effective testing processes, ultimately reducing manufacturing costs and improving product reliability.