Electron Back Scattered Diffraction

Electron backscatter diffraction (EBSD) is a microscopy technique used to determine the crystallographic orientation of materials, providing crucial insights into their microstructure and properties. Current research focuses on improving EBSD data acquisition and analysis through advanced computational methods, including deep learning architectures like transformers and convolutional neural networks, and algorithms such as Markov Junior for generating representative microstructures. These advancements aim to accelerate data collection, enhance data quality (e.g., handling missing data or multiple scattering effects), and automate the analysis process, ultimately leading to faster materials characterization and improved understanding of material behavior. This has significant implications for materials science, enabling more efficient materials development and optimization across various applications.