Model Metrology
Model metrology focuses on developing robust methods for evaluating and characterizing the performance of models, particularly in complex systems like language models and those used in industrial metrology. Current research emphasizes data-driven approaches, including machine learning algorithms like deep learning (e.g., fine-tuned Segment Anything Models) and Gaussian Processes, to improve accuracy and efficiency in both model assessment and uncertainty quantification. This field is crucial for ensuring the trustworthiness and reliability of AI systems across diverse applications, from manufacturing process optimization to reliable scientific measurements, by providing rigorous benchmarks and quantifiable metrics.
Papers
September 20, 2024
July 22, 2024
June 24, 2024
June 14, 2024
April 17, 2024
December 13, 2023
November 20, 2023
September 30, 2022