Structured Illumination Microscopy

Structured illumination microscopy (SIM) enhances the resolution of optical microscopes beyond the diffraction limit by using patterned illumination to encode high-frequency information. Current research focuses on improving SIM's speed and robustness, particularly through the development of deep learning-based reconstruction methods, including physics-informed neural networks and novel space-time models that handle dynamic samples. These advancements aim to reduce acquisition time, minimize light exposure, and enable real-time imaging of dynamic processes, significantly impacting biological and medical imaging applications. The resulting improvements in speed and efficiency make SIM more accessible and applicable to a wider range of scientific investigations.