cs.CVJan 14, 2026

Knowledge-Embedded and Hypernetwork-Guided Few-Shot Substation Meter Defect Image Generation Method

Authors: Jackie Alex, Justin Petter

Organizations: St. Petersburg College

Abstract

Substation meters play a critical role in monitoring and ensuring the stable operation of power grids, yet their detection of cracks and other physical defects is often hampered by a severe scarcity of annotated samples. To address this few-shot generation challenge, we propose a novel framework that integrates Knowledge Embedding and Hypernetwork-Guided Conditional Control into a Stable Diffusion pipeline, enabling realistic and controllable synthesis of defect images from limited data. First, we bridge the substantial domain gap between natural-image pre-trained models and industrial equipment by fine-tuning a Stable Diffusion backbone using DreamBooth-style knowledge embedding. This process encodes the unique structural and textural priors of substation meters, ensuring generated images retain authentic meter characteristics. Second, we introduce a geometric crack modeling module that parameterizes defect attributes--such as location, length, curvature, and branching pattern--to produce spatially constrained control maps. These maps provide precise, pixel-level guidance during generation. Third, we design a lightweight hypernetwork that dynamically modulates the denoising process of the diffusion model in response to the control maps and high-level defect descriptors, achieving a flexible balance between generation fidelity and controllability. Extensive experiments on a real-world substation meter dataset demonstrate that our method substantially outperforms existing augmentation and generation baselines. It reduces Frechet Inception Distance (FID) by 32.7%, increases diversity metrics, and--most importantly--boosts the mAP of a downstream defect detector by 15.3% when trained on augmented data. The framework offers a practical, high-quality data synthesis solution for industrial inspection systems where defect samples are rare.

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