Segmenting Low-Contrast XCTs of Concrete: An Unsupervised Approach

Segmentation of complex structures in X-ray tomographic data is a fundamental task in biomedical research, but it often requires large amounts of precisely annotated data, making fully supervised approaches costly and difficult to scale. In this study, weakly supervised deep learning is investigated as a strategy to reduce annotation effort while maintaining accurate segmentation. A two-dimensional convolutional neural network based on the nnU-Net framework was adapted to a weak supervision setting using sparse dot-based annotations, complemented by a limited number of fully segmented images. The approach was evaluated on high-resolution microCT slices of rat kidneys, targeting the segmentation of renal glomeruli, which are small, low-contrast anatomical structures. Results indicate that weak supervision provides a meaningful learning signal, enabling reliable localization of glomeruli even in the absence of dense labels. Incorporating a small set of high-quality annotations substantially improves segmentation performance, approaching that of a fully supervised model. These findings highlight the potential of weakly supervised learning as an annotation-efficient strategy for the analysis of complex structures in X-ray tomographic data, and suggest that alternative loss formulations tailored to sparse annotations may further enhance performance.

X-ray tomography enables nondestructive characterization of material microstructures, while advances in micro-CT imaging have accelerated volumetric data acquisition and reconstruction. However, rapid interpretation remains limited by image segmentation, which often requires manual thresholding, user prompting, or material-specific model training. We present a zero-setup framework for multi-phase segmentation of synchrotron X-ray tomography data that generates interpretable masks for previously unseen datasets without user input or retraining during deployment. The framework combines a material-agnostic mask preparation strategy with a pretrained semantic segmentation network. It represents commonly occurring structural regions as background, sample, bright, dark-gray, light-gray, and porosity masks. Unlike conventional deep learning pipelines that require dataset-specific annotations and retraining, the proposed framework can be applied directly to new scans and produce diagnostic-level segmentations within minutes of reconstruction. This enables rapid assessment of scan quality, sample morphology, porosity, and attenuation variations during ongoing beamline experiments. The generated masks can later be manually refined or used to fine-tune application-specific models when greater accuracy or material-specific labeling is required. Evaluation on held-out synchrotron micro-CT images and qualitative testing on additional datasets demonstrate consistent and physically meaningful segmentations across varying samples and imaging conditions. The framework also substantially outperforms conventional intensity-based thresholding. By connecting high-speed reconstruction with immediate interpretation, the approach supports near-real-time beamline feedback and scalable AI-assisted scientific imaging workflows.

Defect segmentation in additive manufacturing (AM) X-ray computed tomography (XCT) images remains challenging due to severe class imbalance and large distribution shifts across scan conditions. Although recent foundation models such as the Segment Anything Model (SAM) provide strong general-purpose segmentation priors, their natural-image pre-training transfers poorly to the AM XCT domain, where defects appear as subtle non-semantic microstructural anomalies. Moreover, adapting SAM to the AM domain is further limited by the large domain gap and scarcity of labeled real XCT data. We present XCT-SAM, a sequential parameter-efficient adaptation framework for AM XCT defect segmentation. Instead of adapting SAM directly from natural images to XCT data, we first fine-tune Conv-LoRA adapters on an alloy-microstructure dataset and subsequently transfer the adapted model to XCT images, progressively bridging the domain gap. Using Conv-LoRA adapters with rank r=2, the framework injects convolutional spatial inductive bias into SAM's backbone while training approximately 4.15M parameters and keeping over 99% of the model frozen. We evaluate XCT-SAM on out-of-distribution CycleGAN-XCT benchmarks and real-world NIST XCT scans. Across both settings, XCT-SAM consistently outperforms zero-shot SAM and other domain-adapted SAM baselines, achieving the best overall IoU and Dice scores. These results demonstrate the effectiveness of intermediate domain adaptation with parameter-efficient adapters for industrial XCT defect segmentation. The source code is publicly available at https://github.com/Mahedi-61/XCT-SAM.git