Organizations: School of Cyber Science and Technology, Shenzhen Campus of Sun Yat-sen University · School of Artificial Intelligence and Robotics, Hunan University · Department of Computer and Information Science, University of Macau · School of Computer Science and Technology, Ocean University of China
Abstract
Industrial anomaly detection and localization are limited by scarce real anomalies and pixel-level annotations, a bottleneck that synthetic image-mask pairs can alleviate. However, existing few-shot mask-guided generation may over-follow mask geometry, produce weak anomalies, or use condition masks incompatible with the current object instance. We propose OSAGEN, which combines object-aware mask priors with multistage decoupled diffusion. Its three-stage adaptation sequentially learns normal appearance, defect appearance under coarse conditions, and fine-grained mask calibration, improving defect realization and local control. QBG injects object structure from a matched normal image into mask diffusion to produce object-aware priors, while ISC restricts anomaly propagation and preserves normal content during sampling. A lightweight materialization step recovers pixel-level labels aligned with the realized defects. On MVTec AD and VisA, OSAGEN achieves AP-P/F1-P scores of 88.1/82.2 and 68.5/66.1, respectively, under a unified downstream localization protocol. The code will be released upon acceptance.
Industrial anomaly inspection faces a major challenge due to the lack of real-world anomaly samples. While generative models are used to create anomaly data, existing methods still struggle when handling small-scale anomalies. This failure occurs because extreme downsampling in diffusion models causes the information of small anomalies to be lost in the latent space. To address this, we introduce UniScale, a unified training and inference framework for high-fidelity industrial anomaly generation across arbitrary scales. During training, we introduce an Error-Suppressed Multi-Scale Training (EMT) strategy, which enables the model to learn the rich location-aware textures of anomalies, while suppressing upsampling-induced interpolation errors in texture acquisition, ensuring the model is capable of learning small-scale anomalies, while remaining effective for regular scale anomalies. For inference, we propose Generation-then-Fusion Denoising. It decouples anomaly generation from background integration, preventing small anomalies from being overwhelmed. Extensive experiments demonstrate that our method outperforms state-of-the-art competitors in both anomaly generation quality and downstream detection performance. It achieves a relative IS(a) improvement of 45.86% (from 1.81 to 2.64) on VisA and 37.70% (from 1.22 to 1.68) on MVTec AD 2, while also improving the downstream pixel-level IoU by 4.22% on VisA and AUROC by 6.55% on MVTec AD 2. Code is available at https://github.com/HUST-SLOW/UniScale.
Industrial anomaly inspection is severely hindered by the scarcity of real anomalous data. Zero-shot industrial anomaly generation addresses this by generating anomalies on specific products without requiring any of their real anomalous images. However, existing methods suffer from two critical limitations, i.e., inaccurate anomaly information acquisition and uncontrolled anomaly-product fusion. To overcome these challenges, we propose DeCo, which decouples the anomaly structure from its source product, and explicitly recouples it with the normal textures of the target product. During anomaly information acquisition, Dual-Routing Flow (DR-Flow) binds the texture-invariant anomaly structure to an abnormal token, while a parallel constraint, Product-Invariant Flow (PI-Flow), prevents the abnormal token from binding the source product. During anomaly-product fusion, we propose a hybrid injection to recouple the acquired anomaly structure with the target product, and Product Compatibility Correction (PCC) to compensate for the incompatibility between the acquired anomaly structure and the product. Extensive experiments demonstrate that DeCo establishes a new state-of-the-art. Training downstream detection models on our generated data yields massive pixel AP improvements of 5.1% on MVTec AD and 8.2% on VisA. Code is available at https://github.com/HUST-SLOW/DeCo.
Industrial surface defect detection often suffers from limited defect samples, severe long-tailed distributions, and difficulties in accurately localizing subtle defects under complex backgrounds. To address these challenges, this paper proposes an unsupervised defect detection method that integrates a Denoising Diffusion Probabilistic Model (DDPM) with an asymmetric teacher-student architecture. First, at the data level, the DDPM is trained solely on normal samples. By introducing constant-variance Gaussian perturbations and Perlin noise-based masks, high-fidelity and physically consistent defect samples along with pixel-level annotations are generated, effectively alleviating the data scarcity problem. Second, at the model level, an asymmetric dual-stream network is constructed. The teacher network provides stable representations of normal features, while the student network reconstructs normal patterns and amplifies discrepancies between normal and anomalous regions. Finally, a joint optimization strategy combining cosine similarity loss and pixel-wise segmentation supervision is adopted to achieve precise localization of subtle defects. Experimental results on the MVTecAD dataset show that the proposed method achieves 98.4% image-level AUROC and 98.3% pixel-level AUROC, significantly outperforming existing unsupervised and mainstream deep learning methods. The proposed approach does not require large amounts of real defect samples and enables accurate and robust industrial defect detection and localization. \keywords{Industrial defect detection \and diffusion models \and data generation \and teacher-student architecture \and pixel-level localization}