Real Faults in Deep Learning Fault Benchmarks: How Real Are They?

Deep learning systems often fail due to subtle implementation faults that alter training behavior. Recent work has studied how to detect and diagnose such failures from changes observed across training epochs. However, the software engineering community still lacks a public dataset of per-epoch training runs with documented fault history, feature extraction details, and clear reuse support for fault detection and diagnosis tasks. We present Deep4ge, a controlled benchmark of 14,227 training runs generated from 59 adapted TensorFlow/Keras deep neural network (DNN) programs collected from Stack Overflow. We generated faulty variants using 27 source-code transformations that introduce known faults across seven categories. The dataset contains 9,845 faulty runs and 4,382 correct baseline runs. For each run, we record 4 evaluation metrics and 26 features that measure training behavior at every epoch. These features capture weights, gradients, activations, accuracy and loss trends, learning rate, and hardware use. Deep4ge supports binary fault detection, multi-class fault diagnosis, and early fault prediction from partial training runs. We release the dataset and fault-injection framework at https://doi.org/10.5281/zenodo.20337241.

Deep Learning (DL) programs can fail during training for many reasons, and diagnosing the cause is a costly and time-consuming maintenance task. Techniques for diagnosing such failures are commonly assessed using within-program cross-validation, which may be inadequate for deployment settings involving previously unseen programs. It is therefore necessary to assess how performance differs across these settings and to identify the causes of any performance gap in established fault diagnosis techniques for DL. We investigate this gap using DynFault, a corpus of 5,542 fault-injected training traces from 38 real-world DL programs. We found a gap of 0.190 in balanced accuracy for existing fault diagnosis techniques between within-program evaluation and holding out whole programs. We also found the gap comes from program-level structure in the features, which led us to examine two runtime feature sets, curvature features and optimizer features, and their behavior on unseen programs. We found that curvature features are useful for instability detection on unseen programs, while optimizer and activation features help only on programs seen during training.

Mutants support testing and debugging in two roles: (i) as test goals and (ii) as substitutes for real faults. Hard-to-kill mutants provide better guidance for test improvement, while realism is essential when mutants are used to simulate real bugs. Building on these roles, selective mutation for deep learning (DL) aims to reduce the cost of mutant generation and execution by choosing operator configurations that yield resistant and realistic mutants. However, the DL literature lacks a unified measure that captures both aspects. This study presents a probabilistic framework to quantify mutant quality along two complementary axes: resistance and realism. Resistance adapts the classical notion of hard-to-kill mutants to the DL setting using statistical killing probabilities, while realism is measured via the generalized Jaccard similarity between mutant and real-fault detectability patterns. The framework enables ranking and filtering of low-quality mutation-operator configurations without assuming a specific use case. We empirically evaluate the approach on four datasets of real DL faults. Three datasets (CleanML, DeepFD, and DeepLocalize) are used to estimate and select high-quality operator configurations, and the held-out defect4ML dataset is used for validation. Results show that quality-driven selection reduces the number of generated mutants by up to 55.6% while preserving typical levels of resistance and realism under baseline-aligned selection thresholds. These findings confirm that dual-objective selection can lower cost without compromising the usefulness of mutants for either role.