Organizations: Dept. of AMCS, University of Iowa, Iowa City, IA, USA · Dept. of ECE, California State University, Northridge, CA, USA · Dept. of EECS, University of California, Berkeley, CA, USA · Dept. of ECE, University of Iowa, Iowa City, IA, USA
We study neural networks (NNs) operating under hardware-induced memory faults and computational errors, which can degrade reliability in safety-critical applications. To address this challenge, we propose a novel real-valued error correction coding (ECC) framework capable of detecting and correcting both types of errors. Our approach imposes structured real-valued linear constraints on network weights, enabling efficient error detection and recovery without increasing the number of parameters or compromising classification performance. The proposed method leverages linear programming and sparse recovery techniques to achieve low-complexity error correction. To the best of our knowledge, this is the first real-number-based ECC scheme that simultaneously addresses memory and computational errors in neural networks.
Figures & tables
Fig. 1 : Numerical results of MNIST test classification accuracy for ECC-DNN with and without error correction under varying numbers of weight errors.
Fig. 2 : Numerical results of CIFAR-10 test classification accuracy for ECC-DNN, with and without error correction
Modern Deep Learning (DL) workloads are increasingly deployed in safety-critical domains, such as automotive systems and hyperscale data centers, where transient hardware faults pose a serious threat to system reliability. These workloads are highly memory-intensive, and their correct functionality strongly depends on model parameters stored in memory, which are typically protected using Error Correction Codes (ECCs). In this work, we study ECC's impact on such models and propose two lightweight alternatives to ECCs that achieve superior reliability. The first approach, MSET, selectively hardens the most vulnerable bits in CNN and ViT parameters, while the second approach, CEP, provides fine-grained protection for all parameter bits. Experimental results demonstrate that both methods significantly enhance the reliability of large CNNs and ViTs, mostly outperforming conventional Single Error Detection Double Error Correction (SECDED) ECC schemes, with no memory overhead and, in fact, with considerably lower area and delay characteristics when compared to SECDEC. Experimental results indicate that ViTs can be effectively protected by merely protecting their highest exponent bits in FP16 and FP32 representations. Furthermore, applying the CEP technique can guarantee the resilience of DNNs by up to one order of magnitude higher BERs, with a 3.5x lower area overhead and 7x faster decoder compared to SECDED ECC.
Mohammad Hasan Ahmadilivani, Marten Roots, Marco Restifo +3
Tallinn University of Technology, Tallinn, Estonia · ARM Ltd., Cambridge, United Kingdom
Deep Neural Networks (DNNs) used in safety-critical applications are vulnerable to hardware and memory faults that corrupt network weights and degrade reliability. In this paper, we propose a Center of Gravity (CoG) guided weight correction method that restores faulty weights based on their spatial characteristics within each layer. The proposed approach detects and corrects weight faults using distance-aware correction rules, eliminating the need for retraining or architectural modification. The effectiveness of the proposed method in terms of the capability of tolerating hardware faults has been evaluated through performing fault injection at different Bit Error Rates (BERs). Experiments on safety-critical LSTM-based Networks, including StageNet for disease progression tracking and MTFNet for cardiac anomaly detection, demonstrate fault tolerance improvements of up to 230x and 6.41x, respectively, at a BER of 10^{-3}, with negligible accuracy loss. When extended to Convolutional Neural Networks (CNNs), the method achieves up to 49.55x and 20.79x improvements under comparable fault conditions on ResNet-18 and VGG-16, respectively. To the best of our knowledge, this is the first work to apply the CoG concept to neural network weight tensors for enhancing model reliability.
Bahram Parchekani, Samira Nazari, Ali Azarpeyvand +3
University of Zanjan, Zanjan, Iran · Tallinn University of Technology, Tallinn, Estonia
Deep learning (DL) models are increasingly being deployed into radiation-challenging environments in spacecraft, particle accelerators, and, soon, space-based data centers. Instantiated as a learned orchestration of numbers stored in persistent memory, models are susceptible to continual degradation as high-energy particles corrupt data. At inference time, new data passed through the network fundamentally break the off-line assumptions and guarantees of a static model determined during training. To preserve the quality and efficacy of the models, fault tolerance against bit flips is a clear objective. In this work we developed a runtime method for repairing the quantized weights of neural networks (NNs) after bit flips on commodity, commercial off-the-shelf (COTS) hardware, without storing extra replicas. Our work extends the well-established Fault-Aware Training (FAT) paradigm by adding an alignment penalty to concentrate undamaged activations and weights into a low-rank subspace, and we then reconstruct flagged corrupted coordinates from the uncorrupted survivors. We call this method {\it Projection Healing} and apply it to six regression benchmarks on quantized NNs. Holding a FAT checkpoint fixed and toggling only the runtime heal gives a further ∼23% reduction in the native-unit excess integral. Across those datasets the method extends the operational scrub interval by a median of 2.04× at a +5% RMSE degradation and 1.96× at +50%, compared with 1.62× and 1.07× for classical Single Error Correction, Double Error Detection (SECDED). This introduces a new path towards designing resilient data-driven models, complementing established hardware redundancy, ECC, and FAT-based techniques.
Peter Xiangyuan Ma, Joshua S. Bloom
Department of Astronomy, University of California, Berkeley, CA 94720, USA