SPARC: Scenario Planning and Reasoning for Automated C Unit Test Generation

Large Language Models (LLMs) are increasingly used for automated unit test generation. However, it remains unclear whether these tests reflect genuine reasoning about program behavior or simply reproduce superficial patterns learned during training. If the latter dominates, LLM-generated tests may exhibit weaknesses such as reduced coverage, missed regressions, and undetected faults. Understanding how LLMs generate tests and how those tests respond to code evolution is therefore essential. We present a large-scale empirical study of LLM-based test generation under program changes. Using an automated mutation-driven framework, we analyze how generated tests react to semantic-altering changes (SAC) and semantic-preserving changes (SPC) across eight LLMs and 22,374 program variants. LLMs achieve strong baseline results, reaching 79% line coverage and 76% branch coverage with fully passing test suites on the original programs. However, performance degrades as programs evolve. Under SACs, the pass rate of newly generated tests drops to 66%, and branch coverage declines to 60%. More than 99% of failing SAC tests pass on the original program while executing the modified region, indicating residual alignment with the original behavior rather than adaptation to updated semantics. Performance also declines under SPCs despite unchanged functionality: pass rates fall to 79% and branch coverage to 69%. Although SPC edits preserve semantics, they often introduce larger syntactic changes, leading to instability in generated test suites. Models generate more new tests while discarding many baseline tests, suggesting sensitivity to lexical changes rather than true semantic impact. Overall, our results indicate that current LLM-based test generation relies heavily on surface-level cues and struggles to maintain regression awareness as programs evolve.

Traditional approaches to test case generation often involve manual effort and incur significant computational overhead. Additionally, these approaches are not scalable, and hence, unsuitable for complex software systems. Recently, Large Language Models (LLMs) have been applied to software testing. However, single-shot prompt engineering-based approaches tend to hallucinate and generate redundant test cases, resulting in fewer branches. To handle the above-mentioned limitations, in this paper, we propose FeedbackLLM, a novel automated language-agnostic test case generation framework based on tightly coupled two-stage approach. In the first stage, FeedbackLLM extracts the input constraints by parsing source code and generates the possible test cases. The quality of the test cases is evaluated in the second stage by the following two specialized LLM feedback agents: (i) Line Feedback Agent: extracts the metadata related to missed line executions and (ii) Branch Feedback Agent: extracts the metadata of the unexecuted branch conditions. The above agents operate in a two-stage process, communicating in tandem, and this procedure is repeated for k-steps. Further, we also introduced a redundancy prevention cache to avoid duplicate API requests and avoid unnecessary execution cycles. The performance of the proposed architecture is evaluated on the standard benchmark programs related to C and Python programs. FeedbackLLM demonstrated more line and branch coverage than baseline tools while scaling linearly in execution time.

Validating changes in low-level C firmware is expensive because unit tests (UTs) are fragile under strict build constraints, where missing headers, unresolved symbols, and dependency mismatches frequently prevent compilation and linking. This study introduces an automated UT authoring workflow for the Open-Source Silicon Initialization Library (openSIL) firmware codebase maintained by Advanced Micro Devices (AMD) that reduces manual effort through a large language model (LLM) guided multi-agent pipeline. The workflow combines automated generation of test scaffolds, library-aware creation or reuse of stubs, mocks, and fakes, and an iterative compile-dispatch repair loop driven by build logs and line-coverage feedback. We evaluate the approach using compilation success, repair iterations, dispatch success, and line coverage, with time, cost, and token usage as secondary measures. Across 76 functions under test, the workflow generated compilable UTs for 73 functions. In a configuration without line coverage guidance or retrieval augmentation, mean line coverage reached 73.9%. On a 48-function subset evaluated under both configurations, mean line coverage reached 98.8% with line-coverage guidance alone and reached 94.7% when combined with vector-database retrieval. Results show that automated generation-and-repair pipelines can substantially improve UT creation efficiency and coverage for constrained firmware environments while reducing manual debugging effort.