VeriHGN: Heterogeneous Graph-Based Congestion Prediction for Chip Layout Verification
Organizations: The University of Texas at Arlington, Arlington, Texas, USA · The University of Texas at Dallas, Dallas, Texas, USA
Abstract
As Very Large Scale Integration (VLSI) designs continue to scale in size and complexity, layout verification has become a central challenge in modern Electronic Design Automation (EDA) workflows. In practice, congestion can only be accurately identified after detailed routing, making traditional verification both time-consuming and costly. Learning-based approaches have therefore been explored to enable early-stage congestion prediction and reduce routing iterations. However, although prior methods incorporate both netlist connectivity and layout features, they often model the two in a loosely coupled manner and primarily produce numerical congestion estimates. We propose VeriHGN, a verification framework built on an enhanced heterogeneous graph that unifies circuit components and spatial grids into a single relational representation, enabling more faithful modeling of the interaction between logical intent and physical realization. Experiments on industrial benchmarks, including ISPD2015, CircuitNet-N14, and CircuitNet-N28, demonstrate that VeriHGN achieves the best or near-best performance over state-of-the-art methods in prediction accuracy and correlation metrics.
Figures & tables
| Dataset | Tech. | #Designs | #Cells | #Nets | #Samples |
|---|---|---|---|---|---|
| ISPD 2015 | – | 20 | 100K–1.2M | 100K–1.3M | 533 |
| CircuitNet-N28 | 28nm | 10 | 35K–1.5M | 38K–1.6M | 3K |
| CircuitNet-N14 | 14nm | 8 | 35K–1.5M | 38K–1.6M | 2K |
| Dataset | Model | Cell-level | Grid-level | ||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|
| MAE | RMSE | Pearson | Spearman | Kendall | MAE | RMSE | Pearson | Spearman | Kendall | ||
| ISPD2015 | GCN | 0.041 | 0.047 | 0.347 | 0.398 | 0.321 | 0.038 | 0.049 | 0.299 | 0.273 | 0.163 |
| GAT | 0.039 | 0.045 | 0.361 | 0.385 | 0.337 | 0.036 | 0.046 | 0.304 | 0.273 | 0.179 | |
| CircuitGNN | 0.034 | 0.040 | 0.598 | 0.322 | 0.217 | 0.042 | 0.049 | 0.364 | 0.162 | 0.134 | |
| MIHC | 0.029 | 0.034 | 0.687 | 0.689 | 0.447 | 0.032 | 0.039 | 0.503 | 0.271 | 0.227 | |
| ST-FPN | 0.039 | 0.043 | 0.533 | 0.332 | 0.290 | 0.037 | 0.041 | 0.483 | 0.375 | 0.208 | |
| Cell-level | Grid-level | |||||
|---|---|---|---|---|---|---|
| Remove Variant | MAE | Spear. | Kend. | MAE | Spear. | Kend. |
| None | 0.037 | 0.548 | 0.414 | 0.034 | 0.401 | 0.308 |
| Hierarchical Grid | 0.039 | 0.511 | 0.383 | 0.038 | 0.342 | 0.261 |
| Grid-Net MP | 0.040 | 0.503 | 0.371 | 0.037 | 0.356 | 0.274 |
| Geom. Cell–Cell MP | 0.038 | 0.527 | 0.396 | 0.035 | 0.381 | 0.290 |
| Gated Aggregation | 0.038 | 0.531 | 0.399 | 0.035 | 0.387 | 0.295 |
| Train Test | Model | MAE | Pears. | Spear. | Kend. | |
|---|---|---|---|---|---|---|
| N14 N14 | MIHC | 0.036 | 0.524 | 0.512 | 0.447 | – |
| N14 N14 | VeriHGN | 0.038 | 0.543 | 0.513 | 0.461 | – |
| N28 N28 | MIHC | 0.036 | 0.661 | 0.522 | 0.396 | – |
| N28 N28 | VeriHGN | 0.037 | 0.663 | 0.548 | 0.414 | – |
| N28 N14 | MIHC | 0.062 | 0.198 | 0.168 | 0.114 | 32.8% |
| N28 N14 | VeriHGN | 0.056 | 0.261 | 0.224 | 0.159 | 43.7% |
| Transfer | 0% | 10% | 30% | 50% | 70% | 90% | Non-trans. |
|---|---|---|---|---|---|---|---|
| N28 N14 | 0.224 | 0.330 | 0.400 | 0.490 | 0.500 | 0.510 | 0.513 |
| N14 N28 | 0.258 | 0.353 | 0.421 | 0.516 | 0.538 | 0.544 | 0.548 |
| Model | Dataset | GC (S,M,L) (s) | Train (min) | Epoch (s) | Inf. (s) | Mem. (GB) |
|---|---|---|---|---|---|---|
| CircuitGNN | ISPD2015 | (8.0, 180.3, 286.4) | 41.3 | 17.0 | 9.0 | 14.0 |
| N14 | (2.5, 160.7, 303.3) | 180.3 | 18.0 | 13.3 | 21.0 | |
| N28 | (2.7, 177.9, 300.0) | 161.7 | 15.0 | 11.3 | 17.0 | |
| MIHC | ISPD2015 | (2.8, 215.4, 678.6) | 97.6 | 29.1 | 14.6 | 18.45 |
| N14 | (3.9, 283.5, 684.0) | 928.6 | 300.2 | 7.3 | 28.56 | |
| N28 | (3.7, 271.5, 584.0) | 842.9 | 283.6 | 26.0 | 38.56 |