A Controlled Diagnostic Study of Hardware-Induced Distortions in Hardware-Aware Training

Traditional CPU, GPU, and NPU architectures are increasingly limited by the von Neumann bottleneck. While In-Memory Computing (IMC) using ReRAM crossbar arrays offers a high-density, energy-efficient alternative, its practical deployment is constrained through their non-idealities. Existing hardware-aware training frameworks often require training from scratch, which is computationally prohibitive for modern large-scale models. In this work, we propose a finetuning-based hardware-aware training algorithm that enables robust DNN deployment on ReRAM with minimal training overhead. Our approach mitigates I-V non-linearity by applying a range-shrunk sinh transformation and incorporates retention errors directly into a regularization loss during the finetuning process. We evaluate our framework across models and tasks such as image classification and question-answering (QA). Experimental results demonstrate that our method achieves similar accuracy on large-scale models like ResNet18 and DeiT-Tiny as the base model. In-case of ImageNet for MobileNetV3 families the technique has only less than 2% accuracy degradation. Further, applying the technique on the SQuAD v2 dataset results in only 1 point degradation of F-1 score.

The energy efficiency of analog computing makes it one of the most promising candidates for deploying resource-intensive machine learning workloads on constrained platforms such as mobile and embedded devices. However, analog accelerators are inherently susceptible to noise and non-idealities arising from physical component variations, whose behavior is further sensitive to environmental factors. These effects can significantly degrade inference accuracy. In this work, we conduct a comprehensive experimental study on a representative example of analog hardware to investigate the impact of temperature. We first characterize the behavior of stochastic and systematic non-idealities across a range of operating temperatures. Following this, we compare a set of simulation-based and hardware-based mitigation strategies aimed at improving robustness against temperature-induced performance degradation. Our results suggest that temperature-induced degradation is driven primarily by systematic non-idealities rather than stochastic noise alone. Noise-aware training improves robustness, while hardware-in-the-loop training and temperature-aware calibration provide the strongest accuracy retention across varying thermal conditions.

Analog in-memory computing (AIMC) performs computation directly within resistive crossbar arrays, offering an energy-efficient platform to scale large vision and language models. However, non-ideal analog device properties make the training on AIMC devices challenging. In particular, its update asymmetry can induce a systematic drift of weight updates towards a device-specific symmetric point (SP), which typically does not align with the optimum of the training objective. To mitigate this bias, most existing works assume the SP is known and pre-calibrate it to zero before training by setting the reference point as the SP. Nevertheless, calibrating AIMC devices requires costly pulse updates, and residual calibration error can directly degrade training performance. In this work, we present the first theoretical characterization of the pulse complexity of SP calibration and the resulting estimation error. We further propose a dynamic SP estimation method that tracks the SP during model training, and establishes its convergence guarantees. In addition, we develop an enhanced variant based on chopping and filtering techniques from digital signal processing. Numerical experiments demonstrate both the efficiency and effectiveness of the proposed method.