AOI-SSL: Self-Supervised Framework for Efficient Segmentation of Wire-bonded Semiconductors In Optical Inspection
Authors: Joaquín Figueira, Rob Van Gastel, Giacomo D'Amicantonio, Zhuoran Liu, Ioan Gabriel Bucur, Faysal Boughorbel, Egor Bondarev
Organizations: AIMS Lab, Eindhoven University of Technology · CoC, ASMPT · iCIS, Radboud University
Abstract
Segmentation models in automated optical inspection of wire-bonded semiconductors are typically device-specific and must be re-trained when new devices or distribution shifts appear. We introduce AOI-SSL, a training-efficient framework for semantic segmentation of wire-bonded semiconductors by combining small-domain self-supervised pre-training of vision transformers with in-context inference that minimizes the need of labeled examples. We pre-train SOTA self-supervised algorithms in a small industrial inspection dataset and find that Masked Autoencoders are the most effective in this small-data setting, improving downstream segmentation while reducing the labeled fine-tuning effort. We further introduce in-context, patch-level retrieval methods that predict masks directly from dense encoder embeddings with negligible additional training. We show that, in this setting, simple similarity-based retrieval performs on par with more complex attention-based aggregation used currently in the literature. Furthermore, our experiments demonstrate that self-supervised pre-training significantly improves segmentation quality compared to training from scratch and to ImageNet pre-trained backbones under a fixed fine-tuning computational budget. Finally, the results reveal that retrieval based segmentation outperforms fine-tuning when targeting single device images, allowing for near-instant adaptation to difficult samples.
Self-supervised learning (SSL) has produced a diverse landscape of vision transformers (ViTs) whose pretrained representations support a wide range of downstream tasks. Towards a better understanding of these models, a body of work has assessed the mechanics of their self-attention as well as the types of information captured across their representations, revealing, for example, stark differences between models trained with contrastive learning (CL) and masked image modeling (MIM). However, the total of these advances on model understanding has to date not yet fully permeated a larger community, where, e.g., insights that are specific to CL models are still at times generalized to MIM models. To make model understanding straightforward and intuitive for a broad community, we propose a simple and easily interpretable visualization protocol. Our protocol is based on visualizing unsupervised semantic segmentation results, yet by no means do we focus on top segmentation performance. Instead, our protocol allows us to easily convey model behavior that consistently emerges across images. Benchmarked on a diverse set of SSL models across layers and representations, our protocol allows us to gain novel insights into distinct positional biases and scaling behaviors, including, e.g., strong boundary artifacts in DINOv3-Large model tokens. These novel insights come on top of more easily conveying a range of previous findings. Our protocol further allows us to clearly visually convey and distinguish between positional effects and the closely related but distinct locality bias, the latter being much more extensively studied in the literature so far. Our protocol is publicly available, serving to catalyze further model understanding for a broad community.
We describe our 4th-place entry to the ICRA 2026 GOOSE 2D Fine-Grained Semantic Segmentation Challenge, which reached a composite mean Intersection-over-Union (mIoU) of 69.73% on the official 1,815-image test set. Our model adapts the image encoder of a recent visual foundation model, Segment Anything Model 3 (SAM3), with a lightweight decoder. Beyond this, we contribute two techniques and one empirical finding: (i) a self-distillation scheme that re-uses SAM3 itself, prompted with ground-truth boxes, as a teacher on the classes where it outperforms our own model; (ii) an image-level multi-scale test-time augmentation scheme that restores multi-scale inference for a fixed-input-size model by rescaling the image rather than the model input; and (iii) the finding that an aggressive photometric distortion from a winning 2025 GOOSE 2D entry, transplanted onto our pipeline, is its single largest source of improvement.
In semiconductor manufacturing, defect analysis is essential, but manual inspection cannot scale. However, existing automated inspection methods remain insufficient for root-cause analysis and process optimization. To this end, we present SePArate, a weakly supervised wafer defect segmentation method. SePArate enables pixel-level separation of patterns by leveraging only image-level annotations. It consists of a three-phase training: encoder pretraining, knowledge transfer to learn spatial cues, and training on synthetic mixed-defect data for accurate segmentation. Experiments demonstrate that SePArate outperforms the baselines.