cs.LGJun 8, 2026

Tight Sample Complexity of Transformers

Authors: Chenxiao Yang, Nathan Srebro, Zhiyuan Li

Organizations: Toyota Technological Institute at Chicago (TTIC)

Abstract

We tightly characterize the VC dimension of depth-LL Transformers with a total of WW parameters, mapping an input sequence of length TT to a single output, establishing an upper bound of O(LWlog⁡(TW))O(L W \log (T W)) and a nearly matching lower bound of Ω(LWlog⁡(TW/L))Ω(L W \log (T W / L)). We further tightly characterize the sample complexity of chain-of-thought learning using such a Transformer, showing teacher forcing (i.e. selecting a predictor consistent with the entire chain-of-thought on training data) learns with sample complexity O(LWlog⁡((T+T′)W))O\left(L W \log \left(\left(T+T^{\prime}\right) W\right)\right) and that any learning rule that uses chain-of-thought data requires at least Ω(LWlog⁡((T+T′)W/L))Ω\left(L W \log \left(\left(T+T^{\prime}\right) W / L\right)\right) examples, where TT is the input length and T′T^{\prime} is the number of autoregressive steps.

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