eess.SYJun 18, 2026

Topological Data Analysis for High-Dimensional Dynamic Process Monitoring

Authors: Angan MukherjeeTyler A. SoderstromMichael J. KurtzVictor M. Zavala

Organizations: Department of Chemical & Biological Engineering, University of Wisconsin-Madison, 1415 Engineering Drive, Madison, WI 53706, USA · ExxonMobil Technology and Engineering, 22777 Springwoods Village Pkwy, Spring, TX 77389, USA

Abstract

Real-time process monitoring requires methods that extract actionable information from high-dimensional time-series data. In this work, we present a new approach for process monitoring that combines tools of topological data analysis (TDA) and machine learning. In the proposed approach, we represent multivariate time-series data as manifolds and use topological descriptors to summarize the structure of such data; we then use a neural ordinary differential equation to learn the dynamic evolution of the topological structure of the system. Using real data from an industrial process, we show that this trajectory-based event detection approach is effective at detecting diverse types of events. We contrast this approach against reconstruction-based approaches such as principal component analysis and autoencoders and against a trajectory-based approach that uses Koopman autoencoders.

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