Industrial inspection requires more than binary anomaly detection: a practical system should determine whether an anomaly exists, localize the defective region, identify the defect type, and provide interpretable visual evidence. Existing CLIP-based methods detect and localize anomalies well but offer limited language-level defect understanding, while instruction-tuned vision-language models can describe defects but do not natively produce pixel-level masks. We introduce GenAU, a Generalist vision-language framework for industrial Anomaly Understanding that unifies image-level detection, pixel-level segmentation, multi-type anomaly detection, and defect analysis in a single instruction-following model. GenAU augments a vision-language model with two segmentation tokens, [SEG_defect] and [SEG_normal], whose hidden states act as language-grounded queries over multi-scale visual features for pixel-level localization; the image-level score fuses this map with the decoder's textual normal/defect decision, while the language decoder produces structured defect-aware responses. Trained with a joint language-modeling and segmentation objective, GenAU covers all four tasks within one architecture and recipe, adding zero-shot multi-type detection and language-grounded defect analysis at a quantified cost to detection and segmentation. Across cross-dataset benchmarks, GenAU attains the strongest image-level detection among CLIP-based zero-shot methods on VisA and Real-IAD, with segmentation approaching but not surpassing specialized CLIP baselines.
Industrial anomaly detection is a critical component of modern manufacturing. Most traditional unsupervised methods rely on modelling normal feature distributions, inherently limiting generalization to unknown categories. To improve generalizability, some recent methods incorporate vision-language models (VLMs) for zero-shot detection via text prompts. However, we observe that reasoning-oriented post-training can cause anomaly discrimination to collapse, with some fine-tuned models performing worse than their base VLMs. Existing methods also provide only textual decisions or coarse boxes, without pixel-level segmentation. A more explicit detection principle comes from human inspection: anomalies are identified by comparing a query image with a defect-free reference. Inspired by this, we propose InspectorGPT, a VLM framework centered on comparative reasoning. Given a normal reference and a query image, InspectorGPT compares them to identify discrepancies and perform multiple inspection tasks with detailed reasoning. We internalize this capability through Chain-of-Thought (CoT) fine-tuning and Group Relative Policy Optimization (GRPO) with tailored, verifiable rewards. We further introduce InspectorGPT-Seg for pixel-level anomaly masks. Segmentation supervision improves anomaly discrimination but weakens semantic reasoning, while joint training fails to balance them. We therefore train the two branches separately and combine them through task-vector fusion. Extensive experiments demonstrate superior multi-dimensional performance and generalization to unseen benchmarks, validating comparative reasoning for comprehensive industrial inspection.
Deep learning-based industrial anomaly detectors often behave as black boxes, making it hard to justify decisions with physically meaningful defect evidence. We propose ZSG-IAD, a multimodal vision-language framework for zero-shot grounded industrial anomaly detection. Given RGB images, sensor images, and 3D point clouds, ZSG-IAD generates structured anomaly reports and pixel-level anomaly masks. ZSG-IAD introduces a language-guided two-hop grounding module: (1) anomaly-related sentences select evidence-like latent slots distilled from multimodal features, yielding coarse spatial support; (2) selected slots modulate feature maps via channel-spatial gating and a lightweight decoder to produce fine-grained masks. To improve reliability, we further apply Executable-Rule GRPO with verifiable rewards to promote structured outputs, anomaly-region consistency, and reasoning-conclusion coherence. Experiments across multiple industrial anomaly benchmarks show strong zero-shot performance and more transparent, physically grounded explanations than prior methods. We will release code and annotations to support future research on trustworthy industrial anomaly detection systems.
Large vision-language models (LVLMs) have recently shown strong potential for industrial anomaly detection (IAD) by providing image-level anomaly judgments and interpretable defect reasoning. However, current LVLM-based IAD methods still struggle to produce precise pixel-level anomaly maps from generated language judgments. We aim to achieve precise pixel-level localization while using language as guidance rather than letting it dominate the visual response. Specifically, we propose \textbf{OPD-IAD}, an evidence-privileged dense on-policy self-distillation framework for LVLM-based IAD. OPD-IAD distills privileged defect evidence onto the model's own on-policy judgment trajectory, enabling the final generated judgment to be learned under dense supervision rather than treated only as a textual answer. The resulting judgment serves as a semantic condition for dense anomaly perception. To turn this condition into dense visual evidence, we introduce \textbf{Language-guided Visual Anchoring}, which uses a judgment reforward to re-encode the image and question under the final-judgment condition into semantic anchors and contrasts them with dense visual features through a contrastive heatmap head to generate anomaly maps. The language judgment therefore provides compact semantic guidance, while dense visual features remain the basis for pixel-level scoring, allowing language to guide anomaly localization without letting language quality directly dictate the pixel-level response. Extensive experiments show that OPD-IAD achieves the best overall performance among LVLM-based IAD methods, leading on most image-level, pixel-level, and QA metrics.