Organizations: Department of Optimization and Mathematics, Payame Noor University, Tehran, Iran. · Department of Electrical and Computer Engineering, SR.C., Islamic Azad University, Tehran, Iran. · Department of Electrical Engineering, National University of Skills (NUS), Tehran, Iran · Department of Electrical Engineering, Se.C, Islamic Azad University, Semnan, Iran
As CMOS technology scales into the deep nanometer regime, digital circuit reliability is increasingly threatened by the combined stochastic effects of Bias Temperature Instability (BTI) and Process Variation (PV). Traditional reliability analysis methods, which rely on computationally intensive simulations or extensive lookup tables, fail to scale efficiently for large designs, creating a critical bottleneck in design space exploration. To address this, we propose SMART, a novel framework that integrates Machine Learning (ML) with Monte Carlo simulation to enable rapid, high-fidelity reliability analysis. SMART employs Random Forest regression to predict gate delay distributions directly, bypassing time-consuming atomic model parameter extractions. Crucially, the model utilizes Bayesian Optimization for automated hyperparameter tuning, ensuring maximum predictive robustness across diverse libraries. Experimental validation on ISCAS85 benchmark circuits demonstrates that SMART achieves a 94.54% reduction in analysis time compared to state-of-the-art methods, while maintaining a remarkable average accuracy error of just 1.63%. By shifting computational complexity to an offline training phase, the proposed framework offers a scalable, accurate solution for designing resilient, reliability-aware digital systems.
This paper proposes a co-optimization framework that jointly optimizes SRAM architecture and transistor sizing using equivalent circuit models. The framework simplifies inactive SRAM cells into equivalent RC loads and static power models, achieving up to 61.4× simulation speedup while maintaining high fidelity (read/write delay error <0.22%, power error <1.68%). A joint search space encompassing architecture parameters and device sizing integrates seven algorithms including SA, PSO, Bayesian Optimization variants, and multi-objective evolutionary algorithms. Based on FreePDK45, ablation experiments confirm complementary gains from architecture selection and transistor sizing. Among all algorithms, MOEA/D achieves the best Figure of Merit (8.2721), yielding 6.2% improvement in SNM, 73.6% reduction in area, and 42.3% reduction in peak power. The framework is publicly available at https://github.com/W1Y1K1/OpenOpt.
Fine-grain clock gating (FGCG) is among the most effective techniques for reducing dynamic power, yet current FGCG optimization flows remain largely manual. Recent LLM-based RTL optimization approaches remain limited by two key drawbacks: (1) the inability to process long waveform traces spanning millions of cycles, and (2) the difficulty of scaling optimization to large hierarchical codebases while preserving correctness. In this work, we present AUTOGATE, the first agentic framework for industry-grade RTL power optimization, enabling workload-aware clock-gating optimization across large hierarchical codebases. AUTOGATE introduces a Machine Learning (ML)-LLM co-design that bridges waveform-level analysis and RTL rewriting. Specifically, we design an ML-based clustering algorithm that distills raw toggling traces into compact, structured representations that guide LLM-based RTL rewriting. This enables accurate identification and application of clock-gating opportunities without requiring LLMs to directly process raw waveform data. To enhance scalability, AUTOGATE employs a hierarchical multi-agent architecture that decomposes large designs into independently optimizable modules, enabling coordinated optimization across deep design hierarchies. We evaluate AUTOGATE on a diverse set of designs ranging from small RTL designs to large industrial-grade codebases. Experimental results show that AUTOGATE consistently reduces dynamic power relative to baselines. Across the small-design suite, AUTOGATE reduces dynamic power by 49.31% on average. On industry-scale designs, it achieves 19.34% and 7.96% dynamic power reductions on NVDLA and BlackParrot, respectively, and up to 6.86% on highly optimized proprietary production designs.
Analog circuit sizing remains a challenging and time-consuming task due to the large design space, strong performance trade-offs, and increasing circuit complexity in scaled technologies. Although recent large language model (LLM)-based methods show promise in improving sample efficiency and interpretability, existing approaches often lack explicit circuit-topology understanding and are mainly evaluated on relatively simple analog building blocks. This paper presents a multi-agent LLM-based framework for complex analog circuit sizing. The proposed framework first analyzes the circuit topology and decomposes the netlist into functional blocks and substructures. It also extracts lightweight design knowledge for reuse. Based on the extracted topology and knowledge, a planner coordinates multiple role-specialized sizing agents to update design variables and achieve global performance specifications. This workflow mimics the collaborative process of an expert analog design team and provides a structured, interpretable, and simulation-driven optimization procedure. The framework was validated on eight circuits, with the largest design containing up to 55 transistors and 60 sizing variables. Notably, for the LDO benchmark, the proposed method achieved a 60% success rate with an average of 83 iterations, where classical optimizers failed to find feasible solutions. Further, ablation studies demonstrate that topology understanding, design-knowledge infusion, and agent specialization provide complementary benefits. The source code is available to support reproducibility.