cs.CVAug 9, 2026

RobustDefect-LLM: Explainable and Robustness-Aware Industrial Surface Defect Classification with Decision Support and AI-Assisted Reporting

Authors: Nazlıcan Düşünmez, Halûk Gümüşkaya

Organizations: Department of Computer Engineering, İstanbul Arel University, 34537 Istanbul, Türkiye

Abstract

This paper presents RobustDefect-LLM, an industrial surface-defect inspection framework integrating deep-learning classification, operator-facing visual evidence, confidence-aware decision support, controlled AI-assisted reporting, traceable storage, and mobile interaction in a unified quality-control workflow. Here, robustness-aware denotes explicit evaluation under controlled image degradation and confidence-aware review routing, not an intrinsic robustness guarantee. Four transfer-learning-based convolutional neural networks, ResNet50, EfficientNet-B0, DenseNet121, and MobileNetV3-Large, were evaluated on 1,799 images from the six-class NEU-DET dataset using fixed training, validation, and held-out in-domain test partitions. MobileNetV3-Large achieved the highest numerical test accuracy (99.26%) and macro F1-score (0.9926), with a bootstrap 95% accuracy CI of 0.9815-1.0000. An exact paired McNemar test found no significant difference from DenseNet121 (p = 1.000). The selected model averaged 0.060 s per CPU forward pass (16.66 FPS). Under combined synthetic degradation, accuracy fell to 87.78% at mild intensity and below 40% at stronger intensities, revealing sensitivity to severe image-quality deterioration. Grad-CAM supplied visual evidence, while predictions with confidence below 0.90 or a top-2 margin below 0.10 were routed to HUMAN REVIEW. This conservative policy provided 12.22% automatic coverage and 100% observed selective accuracy among 33 eligible cases (95% CI: 89.43%-100.00%), while routing both observed classification errors to review. Under nominal controlled conditions, all 100 generated reports passed deterministic consistency checks, with a mean latency of 1.66 s. Results support the feasibility of the integrated workflow while emphasizing the need for calibration, repeated evaluation, and real-world industrial validation.

Explore similar work

CardsList
Jul 6, 2026cs.CV

ICME 2026 Grand Challenge on Cross-Scenario Defect Detection and Fine-Grained Severity Grading for High-Precision Manufacturing

This paper presents the IEEE International Conference on Multimedia and Expo (ICME) 2026 Grand Challenge on Cross-Scenario Defect Detection and Fine-Grained Severity Grading for High-Precision Manufacturing. The challenge is motivated by two key limitations of existing industrial defect inspection systems: (1) current deep learning-based methods often suffer significant performance degradation when deployed in unseen production scenarios, and (2) most benchmarks neglect severity-aware assessment, which is critical for risk control and yield optimization. To address these limitations, we design two complementary tracks: Track 1 (Cross-Scenario Defect Detection) targets accurate defect detection, localization, and classification across diverse unseen production environments; Track 2 (Fine-Grained Severity Grading) requires assigning each detected defect an industry-standard severity level, including Acceptable, Marginal NG, NG, and Gross NG. We construct a large-scale industrial dataset of high-resolution microscopic images spanning seven representative defect categories, comprising over 3,800 images with pixel-level instance annotations for Track 1 and over 2,600 images with severity-grade labels for Track 2. The challenge attracted 86 registered participants with 130 submissions; during the final testing phase, 21 teams submitted results and 12 teams provided models with technical reports. The resulting benchmark, together with the diverse and effective solutions contributed by participating teams, sets a new standard for industrial defect analysis research.
Wei Sun, Weixia Zhang, Linhan Cao +30
Scalable Defect DetectionPixel-Level AnnotationCalibrated Severity
AskPDF
May 18, 2026cs.CV

Network Knowledge Prior Guided Learning for Data-Efficient Surface Defect Detection

Deep learning-based methods have become the de facto standard for industrial defect detection. However, their data-hungry nature and inherent "black-box" characteristics often lead to performance bottlenecks and limited trustworthiness in real-world applications. To address these challenges, this paper proposes a novel knowledge-guided loss function that seamlessly integrates model interpretability into the training process without incurring any additional inference cost. Our method operates in two phases: first, a primary classification network is trained, and its explanations, in the form of saliency maps, are generated as prior knowledge. Second, a multi-task learning framework is established, where the main task performs classification, and an auxiliary task imposes consistency between the saliency maps of the final model and the primary model. This consistency is enforced by a dedicated knowledge-guided loss term, effectively acting as a powerful regularizer to steer the model towards robust feature representations. Extensive experiments on multiple public defect datasets demonstrate that our approach consistently enhances the performance of baseline models in terms of accuracy and AP. Moreover, visual analysis reveals that the proposed method yields more concentrated and human-intelligible saliency maps. This work presents a simple yet effective paradigm for bridging the gap between model performance and interpretability, paving the way for more reliable and high-performing vision systems in industrial quality inspection.
Hang-Cheng Dong, Guodong Liu, Dong Ye +1
Scalable Defect DetectionModel InterpretabilitySaliency
AskPDF
Apr 21, 2026cs.AI

Industrial Surface Defect Detection via Diffusion Generation and Asymmetric Student-Teacher Network

Industrial surface defect detection often suffers from limited defect samples, severe long-tailed distributions, and difficulties in accurately localizing subtle defects under complex backgrounds. To address these challenges, this paper proposes an unsupervised defect detection method that integrates a Denoising Diffusion Probabilistic Model (DDPM) with an asymmetric teacher-student architecture. First, at the data level, the DDPM is trained solely on normal samples. By introducing constant-variance Gaussian perturbations and Perlin noise-based masks, high-fidelity and physically consistent defect samples along with pixel-level annotations are generated, effectively alleviating the data scarcity problem. Second, at the model level, an asymmetric dual-stream network is constructed. The teacher network provides stable representations of normal features, while the student network reconstructs normal patterns and amplifies discrepancies between normal and anomalous regions. Finally, a joint optimization strategy combining cosine similarity loss and pixel-wise segmentation supervision is adopted to achieve precise localization of subtle defects. Experimental results on the MVTecAD dataset show that the proposed method achieves 98.4% image-level AUROC and 98.3% pixel-level AUROC, significantly outperforming existing unsupervised and mainstream deep learning methods. The proposed approach does not require large amounts of real defect samples and enables accurate and robust industrial defect detection and localization. \keywords{Industrial defect detection \and diffusion models \and data generation \and teacher-student architecture \and pixel-level localization}
Shuo Feng, Runlin Zhou, Yuyang Li +1
Scalable Defect DetectionDenoising Diffusion Probabilistic ModelDetection FrameworkArea Under The Receiver Operating Characteristic Curve
AskPDF