Finding the Needle in a Haystack: Test-Time Analog Circuit Representation Adaptation for Bayesian Optimization

Automating analog circuit topology design is essential to reduce the extensive manual effort required to meet increasingly diverse and customized application demands. Recent advances have applied sequence-to-sequence fine-tuning on pretrained language models to directly generate circuit topologies from user specifications in a single pass. However, these one-shot generation methods failed to generate complex circuits due to their exponentially growing search spaces and limited training datasets. In this paper, we present EXPLORE, a search-enhanced framework that integrates simulator-guided Monte Carlo Tree Search (MCTS) with transformer-based decoding to enable test-time scaling for analog topology generation. By leveraging language-model priors and bypassing high-confidence structural tokens, EXPLORE allocates expensive simulator budget primarily toward topology-altering decisions during search. On a 6-component benchmark at a tight tolerance of 0.01, EXPLORE raises the success rate from 12% for one-shot generation and 33% for a sampling-and-filter baseline to 65%, and lowers MSE by over 20% relative to sampling-and-filter under the same search budget. These results establish EXPLORE as the first framework to integrate structured test-time search with LM decoding for analog topology generation, and a practical step toward scaling LLM-driven design automation.

Modern engineering workflows increasingly rely on massive parallel simulation, driving the need for scalable, large-batch Bayesian Optimization (BO). Existing batch BO methods, however, incur large computational cost or rely on approximations that erode batch diversity. We propose B3O (Boltzmann Batch Bayesian Optimization), a framework that reframes batch generation as a pure sampling problem: drawing samples directly from the Boltzmann distribution defined by the acquisition function avoids the bottlenecks of existing large-batch methods. Theoretically, we prove that queries sampled from this distribution incur only negligible additional regret. Empirically, B3O outperforms existing batch BO methods on standard synthetic benchmarks and adapts robustly across complex applied tasks, including multi-objective electrode design and mixed-variable race car configuration.

Analog circuit design automation using reinforcement learning (RL) has emerged as a promising approach for reducing manual effort. However, many existing RL-based methods focus on single-objective optimization. Even methods designed for multi-objective (MO) problems often reduce multiple design specifications to a single scalar reward. This simplification limits the ability to capture the true Pareto trade-off among competing objectives and often leads to suboptimal designs. Moreover, requiring the model to be retrained from scratch whenever the desired MO specifications change remains a key limitation. To address these challenges, we present ORACLE, an open-source RL-based framework for MO analog circuit design optimization that replaces scalar reward optimization with vector-valued learning and preference-aware conditioning. ORACLE represents a true MO analog circuit design optimizer that uses a preference vector to specify the relative weights of multiple objectives, enabling a single trained model to generate designs across diverse trade-off settings without retraining. We further propose two preference-guidance strategies, namely normalized-weight guidance and cosine-aligned guidance, to improve convergence. In addition, we incorporate a large language model (LLM)-guided action selection mechanism to filter actions that are likely to lead to suboptimal designs or increased runtime. Our results show that, on multiple circuit topologies with 2,000 test cases, ORACLE reduces runtime by 20.4x - 104.4x compared to state-of-the-art approaches. It also meets 99.9% of the 2,000 target specifications, and achieves 5.1x - 318.6x better figure of merit in the resulting output specs.