cs.CVAug 18, 2026

Continuity-Driven Representation Learning for Industrial Defect Detection

Authors: Minjong Kim, Hyun Jun Kim, Jeongrae Kim, Heeseung Shin, Changwon Lim

Organizations: Chung-Ang University Seoul, Republic of Korea

Abstract

Industrial defect detection differs from natural-image object detection because inspection images are captured under controlled conditions and contain large normal-dominant regions with repetitive structures. Defects therefore appear as localized disruptions of otherwise predictable patterns, while conventional detectors rely mainly on sparse bounding-box supervision, resulting in weakly constrained normal-region representations. We propose a continuity-driven representation regularization framework that exploits normal-dominant regions as dense auxiliary supervision. The framework introduces two detector-agnostic objectives: Multi-Continuity Loss, which combines 1D patch-sequence prediction and 2D masked spatial prediction, and Differencing Loss, which regularizes first-order feature variation and second-order curvature between neighboring patch embeddings. Both objectives are applied with box-derived region weighting to stabilize normal-region representations while preserving defect-related discontinuities. Experiments on two real-world industrial datasets and the public NEU-DET benchmark, using six detector architectures including YOLO-family models, MambaYOLO, and DETR, demonstrate consistent improvements over native detector baselines. In the full-data setting, the proposed regularizers improve average [email protected]:0.95 by up to 3.49 percentage points on Industrial Metal, 5.38 percentage points on MEA, and 5.03 percentage points on NEU-DET. Under limited-data conditions, the gains become more pronounced, with Differencing Loss achieving improvements of up to 21.07 percentage points in [email protected] and 8.23 percentage points in [email protected]:0.95 on NEU-DET using only 25% of the training data. These results suggest that continuity-driven regularization provides an effective prior for improving industrial defect detection, particularly when annotated data are scarce.

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