Deep clustering is a powerful approach for discovering meaningful structures in high-dimensional data by learning a low-dimensional latent representation prior to clustering. Despite its empirical success, assessing the statistical reliability of the resulting clusters remains challenging. Testing discovered clusters on the same data induces selection bias and invalidates classical p-values. Selective inference (SI) provides a principled framework for correcting this bias, but existing methods focus on clustering performed directly on the observed features. In this work, we develop an SI framework for deep clustering with a fixed pretrained encoder. The key challenge is that cluster assignments are determined through a nonlinear transformation from the original data space to the latent space, resulting in a substantially more complex selection process than in conventional clustering. Our method provides a computationally tractable way to account for this process and enables valid statistical testing of differences between clusters identified in the latent space. Synthetic experiments demonstrate that the proposed method controls the Type I error rate while achieving higher power than valid but conservative baselines, and genomic applications show that it can identify significant cluster differences while appropriately accounting for selection bias. Our framework provides a principled approach to quantifying the statistical reliability of structures discovered by deep clustering.
Deep learning methods have proved highly effective for classification and image recognition problems. In this paper, we ask whether this success can be transferred to hypothesis testing: if a neural network can distinguish, for example, an image of a handwritten digit from another, can it also distinguish an "image of a sample" (such as a scatter plot) generated under a given statistical model from one generated outside that model? Motivated by this idea, we propose a novel procedure called deep-testing, which approaches the classical inferential problem of hypothesis testing through deep learning. More specifically, the test statistic is a classification map learned by a deep neural network from simulated data satisfying the null and alternative hypotheses, leveraging its strong discriminating power to construct a highly powerful test. As a proof of concept, we apply deep-testing to the problem of independence testing, arguably one of the most important problems in statistics. In a large-scale simulation study, deep-testing achieves the highest overall power against nineteen competing methods across a broad range of complex dependence structures, confirming the viability of the proposed approach.
Gery Geenens, Pierre Lafaye de Micheaux, Ivan Muyun Zou
Unsupervised learning of high-dimensional data is challenging due to irrelevant or noisy features obscuring underlying structures. It's common that only a few features, called the influential features, meaningfully define the clusters. Recovering these influential features is helpful in data interpretation and clustering. We propose i-IF-Learn, an iterative unsupervised framework that jointly performs feature selection and clustering. Our core innovation is an adaptive feature selection statistic that effectively combines pseudo-label supervision with unsupervised signals, dynamically adjusting based on intermediate label reliability to mitigate error propagation common in iterative frameworks. Leveraging low-dimensional embeddings (PCA or Laplacian eigenmaps) followed by k-means, i-IF-Learn simultaneously outputs influential feature subset and clustering labels. Numerical experiments on gene microarray and single-cell RNA-seq datasets show that i-IF-Learn significantly surpasses classical and deep clustering baselines. Furthermore, using our selected influential features as preprocessing substantially enhances downstream deep models such as DeepCluster, UMAP, and VAE, highlighting the importance and effectiveness of targeted feature selection. Code is available at: [https://github.com/mc25800852/i_if_learn].
Clustering is widely used for exploratory analysis and scientific discovery, driving insights from market segmentation to biological data analysis, but its outputs can be difficult to interpret, audit, and reproduce as modern datasets become increasingly large and complex. Reliable use of clustering requires understanding which features drive the discovered structure, yet feature-level explanations for clustering remain scarce compared with methods in supervised learning. Furthermore, existing clustering feature importance scores are often tied to specific algorithms and data assumptions. To address these challenges, we propose Cluster LOCO (Leave-One-Covariate-Out), a family of model-agnostic feature importance scores for clustering. Cluster LOCO is built on feature occlusion and clustering generalizability, defined as whether cluster labels learned on one subset of the data can be accurately predicted on held-out samples. For any chosen clustering algorithm, Cluster LOCO quantifies a feature's importance by measuring how much its removal degrades generalizability. We first introduce Cluster LOCO-Split, which relies on data splitting, and then extend it to Cluster LOCO-MP, a minipatch ensemble-based version designed for large-scale data. Across synthetic simulations and an application to cell-type discovery in single-cell transcriptomics, we show that Cluster LOCO more reliably recovers informative features than existing clustering feature importance methods.