Verifiable Sampling for Delegated Generative Quantum Machine Learning

Generative models have become central across science and industry, from image and text synthesis to the design of molecules and materials. Quantum generative models are considered one of the most promising applications for quantum computers, since a quantum circuit naturally produces samples from the distribution it encodes, and for suitable circuits that distribution is believed to be hard for any classical computer to reproduce. A leading strategy trains these models on a classical computer and reserves the quantum device for generating samples at deployment. This is possible when the training loss can be evaluated on a classical computer. A prime example is the maximum mean discrepancy (MMD$^2$), a moment-matching loss that compares the model and the data through their Pauli-$Z$ correlations. Research so far has asked whether such models can be trained and whether their sampling is hard; whether minimizing such an objective yields a model that generalizes, rather than one that merely reproduces the training statistics, remains poorly understood. We benchmark thirteen quantum and classical generative models by direct sampling on two application-inspired datasets: first a cardinality-constrained dataset at up to $30$ qubits and second a dataset of genomic single-nucleotide variants, whose valid set is the observed data. Models that converge the loss to the same value differ widely in how much of the unseen valid set they cover. These results indicate that a converged moment-matching loss is not a reliable measure of generalization, and that a train-classical, deploy-quantum workflow has to measure generalization by sampling the trained model, a step that at the sizes of interest is believed to require the quantum device.

Measurement-based quantum computation (MBQC) is a framework for quantum information processing in which a computational task is carried out through one-qubit measurements on a highly entangled resource state. Due to the indeterminacy of the outcomes of a quantum measurement, the random outcomes of these operations, if not corrected, yield a variational quantum channel family. Traditionally, this randomness is corrected through classical processing in order to ensure deterministic unitary computations. Recently, variational measurement-based quantum computation (VMBQC) has been introduced to exploit this measurement-induced randomness to gain an advantage in generative modeling. A limitation of this approach is that the corresponding channel model has twice as many parameters compared to the unitary model, scaling as $N \times D$, where $N$ is the number of logical qubits (width) and $D$ is the depth of the VMBQC model. This can often make optimization more difficult and may lead to poorly trainable models. In this paper, we present a restricted VMBQC model that extends the unitary setting to a channel-based one using only a single additional trainable parameter. We show, both numerically and algebraically, that this minimal extension is sufficient to generate probability distributions that cannot be learned by the corresponding unitary model.

Quantum machine learning integrates the strengths of quantum computing and machine learning, enabling models to learn complex features using fewer parameters than their classical counterparts. Due to the increasing complexity of quantum machine learning models, it is necessary to verify that the implementation of these models satisfy the design specification and be free of bugs and faults. Mutation testing is a promising avenue to identify faulty quantum circuits that do not meet design specifications or contain defects by intentionally inserting faults into the quantum circuit. It is necessary to define mutation operations to inject faults into quantum circuits to ensure that a test suite is robust enough to evaluate an implementation against its design specification. In this paper, we extend mutation testing to quantum machine learning applications, primarily quantum neural network models. Specifically, this paper makes two important contributions. We define new mutation operations for efficient fault insertion compared to state-of-the-art approaches. We also present a directed mutation generation technique to reduce redundant mutant circuits. Extensive experimental evaluation demonstrates that our approach generates a more diverse and representative set of mutants, effectively addressing faults that traditional techniques fail to expose.