AnalogScout: Simulation-Efficient PVT-Aware Analog Sizing with LLM Agents

Analog circuit sizing remains a challenging and time-consuming task due to the large design space, strong performance trade-offs, and increasing circuit complexity in scaled technologies. Although recent large language model (LLM)-based methods show promise in improving sample efficiency and interpretability, existing approaches often lack explicit circuit-topology understanding and are mainly evaluated on relatively simple analog building blocks. This paper presents a multi-agent LLM-based framework for complex analog circuit sizing. The proposed framework first analyzes the circuit topology and decomposes the netlist into functional blocks and substructures. It also extracts lightweight design knowledge for reuse. Based on the extracted topology and knowledge, a planner coordinates multiple role-specialized sizing agents to update design variables and achieve global performance specifications. This workflow mimics the collaborative process of an expert analog design team and provides a structured, interpretable, and simulation-driven optimization procedure. The framework was validated on eight circuits, with the largest design containing up to 55 transistors and 60 sizing variables. Notably, for the LDO benchmark, the proposed method achieved a 60% success rate with an average of 83 iterations, where classical optimizers failed to find feasible solutions. Further, ablation studies demonstrate that topology understanding, design-knowledge infusion, and agent specialization provide complementary benefits. The source code is available to support reproducibility.

We present a design automation framework for analog circuit sizing that produces calibrated, topology-specific analytical equations from raw circuit netlists. A large language model (LLM) derives a complete Python sizing function in which each device dimension is traceable to a specific design rationale - a form of interpretable output absent from existing optimization-based and LLM-based sizing methods. A deterministic calibration loop extracts process-dependent parameters from a single DC operating point simulation, while a prediction-error feedback mechanism compensates for analytical inaccuracies. We validate the framework on circuits ranging from 6 to 30 transistors - spanning single-stage, current-mirror (simple and cascoded), folded-cascode, gain-boosted folded-cascode, two-stage Miller-compensated, nested-Miller-compensated, and complementary class-AB output topologies - across six process nodes from 32 nm to 180 nm. On matched-specification benchmarks, including the class-AB opamp case, the framework converges within a few simulations. Despite large initial prediction errors, convergence depends on the measurement-feedback architecture, not prediction accuracy. The one-shot calibration automatically captures process-dependent variations, enabling cross-node portability without modification, retraining, or per-process characterization.

Analog IC layout design remains a labor-intensive iterative process dominated by simulation-driven refinement. Although end-to-end layout generators accelerate initial placement and routing, they still require experts to manually tune layout optimization parameters with repeated post-layout simulations for stringent design specifications. While Bayesian Optimization (BO) is widely adopted for parameter tuning in analog IC design, at the layout level it typically requires hundreds to thousands of evaluations, each involving costly parasitic extraction and post-layout simulation, which makes it impractical. Recently, Large Language Models (LLMs) have demonstrated potential in improving the sample efficiency of such simulation-driven tuning. However, their restricted access to geometric layout context and design-specific heuristics limits their ability to manipulate the layout optimization process. In this paper, we propose a simulation-aware LLM multi-agent framework that performs in-context policy improvement (ICPI) by iteratively updating layout optimization parameters exposed by an analog layout generator through an act-observe-reflect loop on compact structured layout representations. Experiments on real-world analog circuits show that, with only tens of post-layout simulations, our approach improves post-layout performance over the generator's built-in heuristics and BO-based tuning method.