Open-Set Supervised 3D Anomaly Detection: An Industrial Dataset and a Generalisable Framework for Unknown Defects
Authors: Hanzhe Liang, Luocheng Zhang, Junyang Xia, HanLiang Zhou, Bingyang Guo, Yingxi Xie, Can Gao, Ruiyun Yu, Jinbao Wang, Pan Li
Organizations: Mohamed bin Zayed University of Artificial Intelligence, Abu Dhabi, UAE · Shenzhen Audencia Financial Technology Institute, Shenzhen, China · School of Computer Science, Hangzhou Dianzi University, Hangzhou, China · Software College, Northeastern University, Shenyang, China · College of Computer Science and Software Engineering, Shenzhen University, Shenzhen, China · School of Artificial Intelligence, Shenzhen University, Shenzhen, China · Zhejiang Institute of Artificial Intelligence, Hangzhou, China
Although self-supervised 3D anomaly detection assumes that acquiring high-precision point clouds is computationally expensive, in real manufacturing scenarios it is often feasible to collect a limited number of anomalous samples. Therefore, we study open-set supervised 3D anomaly detection, where the model is trained with only normal samples and a small number of known anomalous samples, aiming to identify unknown anomalies at test time. We present Open-Industry, a high-quality industrial dataset containing 15 categories, each with five real anomaly types collected from production lines. We first adapt general open-set anomaly detection methods to accommodate 3D point cloud inputs better. Building upon this, we propose Open3D-AD, a point-cloud-oriented approach that leverages normal samples, simulated anomalies, and partially observed real anomalies to model the probability density distributions of normal and anomalous data. Then, we introduce a simple Correspondence Distributions Subsampling to reduce the overlap between normal and non-normal distributions, enabling stronger dual distributions modeling. Based on these contributions, we establish a comprehensive benchmark and evaluate the proposed method extensively on Open-Industry as well as established datasets including Real3D-AD and Anomaly-ShapeNet. Benchmark results and ablation studies demonstrate the effectiveness of Open3D-AD and further reveal the potential of open-set supervised 3D anomaly detection.
Figures & tables
Fig. 1: Comparison of 3D anomaly detection settings. Prior methods are unsupervised or rely on synthetic negatives without real negative-sample constraints, the model lacks a clear optimization direction and has no reliable notion of the negative feature distribution, leading to weak anomaly awareness. propose open-set supervised 3D anomaly detection, where the training set includes a few real anomalies from a subset of categories, enabling the model to learn a grounded notion of the negative feature distribution, while testing requires detecting unseen anomaly categories.
Dataset Comparison
Dataset
Class
Synthetic
Anomaly Types
Ratio
MvTec3D-AD [ 2 ]
10
Real
3
∼ 2%
Real3D-AD [ 33 ]
12
Real
2
∼ 3%
Anomaly-ShapeNet [ 23 ]
40
Syn
4
∼ 2%
MulSen-AD [ 24 ]
15
Real
5
∼ 4%
IEC3D-AD [ 16 ]
15
Real
2
∼ 1%
TABLE I: Comparison of representative 3D anomaly detection datasets and learning settings. For fairness, only shared categories across datasets are compared. For the multimodal benchmarks MVTec 3D-AD and MulSen-AD, only anomalies observable in point clouds are considered. As IEC3D-AD is not open source, we contacted the author to obtain details.
Fig. 2: Overview of the Open-Industry, comprising 15 categories, each containing five different anomalies. The red box represents scar, the green box represents scratch, the purple box represents concave, the brown box represents deformation, and the yellow box represents convex. The acquisition system and communication interaction are shown on the right.
Fig. 3: Workflow of our Open3D-AD. It consists of three steps: (i) anomaly synthesis and point-wise feature encoding to form normal/anomalous mixture representations, (ii) greedily subsample the normal support and use it to refine the anomalous support via deconfounding, and (iii) dual-distribution aggregated scoring for anomaly detection.
Method →
PatchCore
BTF
Metrics ↓
FPFH
FPFH+Raw
PointMAE
Raw
FPFH
O-AUROC
51.78
55.63
50.77
93.15
49.40
P-AUROC
54.34
53.14
50.72
66.31
51.14
O-AUPRC
52.45
56.90
53.01
94.15
51.41
P-AUPRC
00.70
00.97
01.30
01.11
00.72
TABLE VI: Performance comparison of self-supervised methods. All results are reported in the Supplementary Materials .
Method
Time Complexity
O-AUROC
P-AUROC
FPS
M1
O(mN)
84.39 ± 0.44
70.52 ± 0.56
8.4
M2
O(1)
80.10 ± 1.32
67.43 ± 2.40
10.1
M3
O(N)
81.33 ± 1.88
68.98 ± 2.18
9.6
M4
O(N2)
83.20 ± 0.95
69.84 ± 2.21
8.8
M5
O(mN)
83.50 ± 4.69
69.66 ± 6.35
9.0
TABLE VII: Performance comparison of different subsampling strategies on Open-Industry under 5 samples supervised.
Method
O-AUROC
P-AUROC
M6
83.08 ± 0.59
69.18 ± 0.40
M7
83.16 ± 0.29
70.17 ± 0.79
M8
83.21 ± 0.58
70.25 ± 0.24
M9
84.39 ± 0.44
70.52 ± 0.56
TABLE VIII: Ablation study on Open-Industry under the 5 samples per-class supervision setting.
Fig. 4: Feature distribution visualizations in the training and inference stages. A and B show selected training features of Normal, Seen Abnormal, and Simulated Abnormal. C and D show selected test features of Normal, Seen Abnormal, and Unseen Abnormal. SS denotes the Silhouette Score. In A and B, SS1 , SS2 , and SS3 correspond to Normal vs. Seen Abnormal, Normal vs. Simulated Abnormal, and Seen Abnormal vs. Simulated Abnormal, respectively. In C and D, they correspond to Normal vs. Seen Abnormal, Normal vs. Unseen Abnormal, and Seen Abnormal vs. Unseen Abnormal, respectively.
Point cloud anomaly detection identifies and localizes unusual 3D geometry or surface defects, often in industrial inspection with few labeled failures.
the National Center of Technology Innovation for Intelligent Design and Numerical Control, Huazhong University of Science and Technology, Wuhan 430074, China · the Department of Intelligent Manufacturing, Contemporary Amperex Technology Ltd., Ningde 352000, China · the Institute for Infocomm Research, A*STAR, Singapore 138632 +2
School of Computer Science, Wuhan University, Wuhan 430072, Hubei, China · Guangdong Laboratory of Artificial Intelligence and Digital Economy (SZ), Shenzhen 518060, Guangdong, China · School of Information and Software Engineering, East China Jiaotong University, Nanchang 330013, Jiangxi, China +1
College of Computer Science and Software Engineering and the Guangdong Key Laboratory of Intelligent Information Processing, Shenzhen University, Shenzhen 518060, China