SolarFCD: A Large-Scale Dataset and Benchmark for Solar Fault Classification in Photovoltaic Systems

The rapid expansion of solar photovoltaic (PV) systems has increased the need for reliable and scalable fault classification, as manual inspection is impractical at scale. Thermal infrared (IR) imaging provides a non-contact solution for identifying PV faults; however, accurate classification remains challenging due to class imbalance, limited texture information, and subtle thermal differences. In this work, we investigate the applicability of Joint-Embedding Predictive Architecture (JEPA) for thermal IR PV fault classification across various scenarios and propose JEFFNet (JEPA-EFFicientNet), a multibranch architecture that combines JEPA-based self-supervised representation learning with EfficientNetV2-S-based supervised convolutional feature extraction. JEFFNet fuses semantic representations from a JEPA-pretrained Vision Transformer with convolutional features from EfficientNetV2-S, enabling complementary feature learning. JEFFNet is evaluated on two public thermal IR datasets, PVF-10 and InfraredSolarModules (ISM), for both multiclass and derived binary (healthy/faulty) classification. On PVF-10, JEFFNet achieves an F1-score of $93.21$ and an accuracy of $94.33$ in the 10-class task, and an F1-score of $97.53$ and an accuracy of $96.41$ in the derived 2-class task. On ISM, JEFFNet achieves an F1-score of $72.60$ and an accuracy of $83.88$ in the 12-class task, and an F1-score of $94.69$ and an accuracy of $94.78$ in the derived 2-class task. JEFFNet also uses only 108.6M parameters versus 205.91M for GEPFNet, a 47.2% reduction. These results demonstrate that combining self-supervised semantic and supervised convolutional features provides an effective, parameter-efficient solution for thermal IR PV fault classification. The source code is publicly available at https://github.com/Azimi2kht/JEFFNet

To ensure energy efficiency and reliable operations, it is essential to monitor solar panels in generation plants to detect defects. It is quite labor-intensive, time consuming and costly to manually monitor large-scale solar plants and those installed in remote areas. Manual inspection may also be susceptible to human errors. Consequently, it is necessary to create an automated, intelligent defect-detection system, that ensures continuous monitoring, early fault detection, and maximum power generation. We proposed a novel hybrid method for defect detection in SOLAR plates by combining both handcrafted and deep learning features. Local Binary Pattern (LBP), Histogram of Gradients (HoG) and Gabor Filters were used for the extraction of handcrafted features. Deep features extracted by leveraging the use of DenseNet-169. Both handcrafted and deep features were concatenated and then fed to three distinct types of classifiers, including Support Vector Machines (SVM), Extreme Gradient Boost (XGBoost) and Light Gradient-Boosting Machine (LGBM). Experimental results evaluated on the augmented dataset show the superior performance, especially DenseNet-169 + Gabor (SVM), had the highest scores with 99.17% accuracy which was higher than all the other systems. In general, the proposed hybrid framework offers better defect-detection accuracy, resistance, and flexibility that has a solid basis on the real-life use of the automated PV panels monitoring system.

This paper addresses the challenge of multi-label defect classification in electroluminescence (EL) images of photovoltaic (PV) cells. Training models on images where multiple defects co-occur creates learning ambiguity, making it difficult to disentangle visual features for specific defect types, a problem compounded by the scarcity of examples for individual classes. To tackle this, we introduce Generative Defect Isolation (GDI), utilizing the LaMa inpainting model with Fast Fourier Convolutions to remove selected defects and generate realistic, single-defect training samples. Extensive experiments on Vision Transformer (ViT-S, ViT-L) and EfficientNetV2-L architectures demonstrate that GDI significantly outperforms baselines. The performance gains are most pronounced in low-data scenarios; class-wise analysis shows substantial improvements, boosting the F1-Score for rare defect classes by up to 63.6%. Furthermore, GDI effectively resolves learning ambiguity from co-occurring defects, yielding a 26% reduction in such co-occurring classification errors. Our work establishes GDI as an effective method for maximizing the value of existing segmentation datasets and sets a new performance benchmark for multi-label classification in this domain.