Image forgery localization remains challenging due to diverse manipulation techniques and distribution shifts. Existing forgery localization models achieve high accuracy on benchmarks but often struggle with cross-domain generalization and robustness. In this paper, we propose SARIF (Segment Anything for Robust Image Forensics), a framework that leverages the Segment Anything Model (SAM), which has a promptable architecture and strong generalization ability. SARIF introduces a feedback-guided mask decoder and a dual-encoder design that extracts forgery-specific information to capture forensic traces while exploiting the SAM architecture. To localize manipulated regions, we design a block-wise prompting mechanism that derives forgery-specific cues from residual features between an adapted encoder and its frozen counterpart. These features are fused with the previous mask prompt to drive a feedback-based mask refinement process, enabling automatic forgery segmentation without manual input. Extensive experiments on standard forgery-localization benchmarks show that SARIF achieves strong average cross-dataset performance and robustness to common image corruptions.