Sketched Linear Contrastive Learning: Approximation, Optimization, and Statistical Scaling

Scaling laws provide compact descriptions of how prediction error varies with compute, model size, and data, but existing theory mainly treats single-sample SGD or full data reuse, leaving the role of mini-batching unclear. We study batch scaling laws for sketched linear regression under a power-law covariance spectrum and a source condition on the target parameter. We analyze one-pass batch SGD, multi-pass batch SGD with replacement, and multi-pass batch SGD without replacement. Our first result is a risk decomposition: all three procedures share the same irreducible and approximation terms, while their stochastic terms depend on the sampling protocol. One-pass batch SGD splits into bias and variance, whereas the two multi-pass methods split into GD bias, GD variance, and a fluctuation term around a common GD reference trajectory. We then prove source-condition scaling laws for one-pass and multi-pass mini-batch methods. For one-pass batch SGD, mini-batching preserves the approximation and optimization-bias exponents, while the variance scales as $O(\min(M,(T_{\mathrm{eff}}γ)^{1/a})/(B T_{\mathrm{eff}}))$. Thus the usual $1/B$ covariance reduction holds at fixed update count $T$, but in the one-pass regime $T=N/B$ it is partly offset by the shorter optimization horizon. For multi-pass batch SGD, with- and without-replacement sampling have identical approximation and GD bias/variance terms; they differ only in the fluctuation covariance prefactor, which is $1/B$ with replacement and $ρ_{N,B}=(N-B)/(B(N-1))$ without replacement. Hence without-replacement sampling is less noisy for $B>1$, and when $B=N$ the fluctuation vanishes, recovering deterministic gradient descent. These results place batch size on the same theoretical footing as compute, data, and model dimension in sketched linear regression.

Contrastive representation learning (CRL) underpins many modern foundation models. Despite recent theoretical progress, existing analyses suffer from several key limitations: (i) the statistical consistency of CRL remains poorly understood; (ii) available generalization bounds deteriorate as the number of negative samples increases, contradicting the empirical benefits of large negative sets; and (iii) the retrieval performance of CRL has received limited theoretical attention. In this paper, we develop a unified statistical learning theory for CRL. For downstream tasks, we evaluate retrieval quality using an AUC-type population criterion and show that the contrastive loss is \emph{statistically consistent} with optimal ranking. We further establish a \emph{calibration-style inequality} that quantitatively relates excess contrastive risk to excess retrieval suboptimality. For upstream training, we study both supervised and self-supervised contrastive objectives and derive generalization bounds of order $O(1/m + 1/\sqrt{n})$ and $O(1/\sqrt{m} + 1/\sqrt{n})$, respectively, where $m$ denotes the number of negative samples and $n$ the number of anchor points. These bounds not only explain the empirical advantages of large negative sets but also reveal an explicit trade-off between $m$ and $n$. Extensive experiments on large-scale vision--language models corroborate our theoretical predictions.

We study scaling laws of signSGD under a power-law random features (PLRF) model that accounts for both feature and target decay. We analyze the population risk of a linear model trained with one-pass signSGD on Gaussian-sketched features. We express the risk as a function of model size, training steps, learning rate, and the feature and target decay parameters. Comparing against the SGD risk analyzed by Paquette et al. (2024), we identify a drift-normalization effect and a noise-reshaping effect unique to signSGD. We then obtain compute-optimal scaling laws under the optimal choice of learning rate. Our analysis shows that the noise-reshaping effect can make the compute-optimal slope of signSGD steeper than that of SGD in regimes where noise is dominant. Finally, we observe that the widely used warmup-stable-decay (WSD) schedule further reduces the noise term and sharpens the compute-optimal slope, when feature decay is fast but target decay is slow.