We show with experiments and system-level simulations that it is possible to successfully mitigate the impact of retention loss on inference accuracy degradation by using both circuit-level compensation techniques and batch normalization recalibration at the algorithmic level. Experiments are performed on a single-poly floating-gate (FG) analog non-volatile memory array for analog in-memory computing fabricated in a standard 65 nm CMOS. We use a model of retention-loss statistics calibrated with experiments to evaluate the system-level impact on neural network models such as VGG-10/CIFAR-10 and WideResNet-28-10/CIFAR-100. We show that, after 60 days since programming, combined mitigation techniques enable to recover the baseline inference accuracy within 2-4%
Analog in-memory computing (AIMC) speeds up neural-network inference by doing the arithmetic directly inside a memory array, instead of shuttling weights back and forth between memory and a processor. This saves energy, but the physical devices that store the weights are imperfect: programming errors, electrical noise, limited-resolution converters, and outright broken cells all distort the computation, and every physical chip is distorted in its own way. A designer with several such chips available faces an uncomfortable choice: run all of them and combine the answers (safe, but wasteful of energy), or trust a single chip blindly (cheap, but with no guarantee on how often it is wrong). This paper introduces RACE-AIMC (Risk-Aware Certified Ensemble for AIMC), a framework that resolves this choice with statistics rather than guesswork. Offline, RACE-AIMC studies a pool of physical accelerators, picks the single best one for a given energy budget, and computes a mathematically exact upper bound on how often that accelerator will be wrong when it chooses to answer. Online, only that one accelerator is switched on; a lightweight check decides whether to accept its answer or defer to a fallback. In our simulations using a noisy weight mapping and multiple independent test runs, every certified bound stayed under a 10% error target (mean bound 7.83% +- 0.89%, with 70.88% +- 0.98% of inputs answered directly). The resulting system matches the accuracy of a clean digital baseline while cutting modeled energy use by 69.02% relative to always running every accelerator in the pool.
Analog compute-in-memory (CIM) enables energy-efficient neural network inference, but device variation and read noise can severely degrade low-bit quantized models. Existing CIM-oriented quantization methods mainly minimize ideal quantization error, ignoring the hardware noise floor and thus causing inefficient precision allocation. We propose NANQ, a noise-aware mixed-precision non-uniform quantization framework for analog CIM. NANQ models magnitude-dependent weight noise from measured responses of an eFlash CIM array and converts the noise profile into an adaptive quantization density, assigning finer resolution to low-noise regions while avoiding ineffective precision in noise-dominated regions. It further assigns layer-wise bit-widths by identifying each layer's precision saturation point under hardware noise using a unified threshold. On-chip experiments on an eFlash CIM SoC show that, under 2-bit weight-magnitude quantization, NANQ improves vision-model accuracy by 8.05 percentage points and reduces language-model PPL by 54.7% on average over PowerQuant. Mixed-precision NANQ captures most of the gains obtainable from additional quantization resources with only 3.2-3.8 equivalent bits.
The energy efficiency of analog computing makes it one of the most promising candidates for deploying resource-intensive machine learning workloads on constrained platforms such as mobile and embedded devices. However, analog accelerators are inherently susceptible to noise and non-idealities arising from physical component variations, whose behavior is further sensitive to environmental factors. These effects can significantly degrade inference accuracy. In this work, we conduct a comprehensive experimental study on a representative example of analog hardware to investigate the impact of temperature. We first characterize the behavior of stochastic and systematic non-idealities across a range of operating temperatures. Following this, we compare a set of simulation-based and hardware-based mitigation strategies aimed at improving robustness against temperature-induced performance degradation. Our results suggest that temperature-induced degradation is driven primarily by systematic non-idealities rather than stochastic noise alone. Noise-aware training improves robustness, while hardware-in-the-loop training and temperature-aware calibration provide the strongest accuracy retention across varying thermal conditions.