cs.CVAug 19, 2026

CDGP: Contrastive Dual Gaussian Processes for Weakly Supervised Anomaly Segmentation

Authors: Seungjun Chu, Seokhee Han, Mateusz Nowak, Peter Chin

Organizations: Korea University · Dartmouth College

Abstract

Industrial visual inspection must both decide whether a product is defective and localize the defect, yet pixel-level masks are costly to collect at scale. Most anomaly-segmentation methods learn only from defect-free images and score deviations from normality. A true defect and an unusual-but-normal region, however, can both deviate substantially and receive similarly high scores. We propose Contrastive Dual Gaussian Processes (CDGP), a weakly supervised framework that models normal and anomaly inducing-variable predictive distributions over dense tokens. Its posterior-dominance statistic standardizes their predictive-mean difference by the joint predictive uncertainty, providing both spatial evidence and image-level confidence. This evidence complements hierarchical normal-reconstruction residuals for fine localization. All calibration uses training data only, without human pixel annotations or test-time fitting. Across MVTec AD2, KSDD2, and VisA, CDGP ranks first among the evaluated methods on all MVTec AD2 localization metrics and is first-place or competitive on KSDD2 and VisA. Factorized and matched linear-head controls delimit the contribution and scope of the linear-kernel Gaussian process (GP) formulation.

Figures & tables

Appendix figures & tables14 assets

Supplementary material from the paper’s appendix.

Appendix

Explore similar work

CardsList
  1. OSAGEN: Object-Aware Mask Priors and Multistage Decoupled Diffusion for Industrial Anomaly Generation

    Jul 31, 2026Jinyi Xu, Peng Chen, Yunkang Cao +3Industrial Anomaly DetectionAnomaly Localization

  2. InspectorGPT: A Comparative Reasoning Enhanced VLM for Comprehensive Industrial Anomaly Detection

    Aug 30, 2026Weifei Chen, Honghao Zhang, Zhiyuan You +1Industrial Anomaly DetectionZero-Shot Anomaly Detection