cond-mat.mtrl-sciAug 23, 2026

Diagnosing and narrowing the simulation-to-real gap in powder X-ray diffraction with a wet-dry agentic loop

Authors: Shaoguang Wang, Weiyu Guo, Ben Fei, Xiaohong Shao, Zhihui Wang, Wanli Ouyang

Organizations: The Hong Kong University of Science and Technology (Guangzhou), Guangzhou, China. · The Chinese University of Hong Kong, Hong Kong SAR, China. · Suzhou National Laboratory, Suzhou, China. · Shenzhen Loop Area Institute, Shenzhen, China. · 

Abstract

Powder X-ray diffraction (PXRD) is the routine probe of crystalline matter, yet its analysis is the rate-limiting step as laboratories automate acquisition. Deep-learning analyzers excel on simulated patterns and degrade on measured ones. This simulation-to-real gap is structural, not additive: synthetic denoising gives no measurable lift on real spectra, whereas correcting a small peak-position drift more than doubles median retrieval correlation. Real-spectrum fine-tuning, peak-aligned reranking, and recalibration narrow what remains and restore the coverage synthetic anchors lose. Xtalyst integrates these in an agent-orchestrated system spanning phase identification, refinement, and calibrated property prediction. On a frozen held-out partition (n=534) each module measured on both splits reproduces its development finding -- including the synthetic-anchor under-coverage, whose magnitude differs between the two pools -- while held-out refinement converges and preserves symmetry without reaching profile-quality fits, and on a diffractometer its wet-dry recommend-rescan-reanalyze loop flips a blinded silicon standard to a gated PASS and changes which minor phase is resolved on a multi-metal alloy.

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