Sierpiński--Knopp Wasserstein Distance for Persistence Diagrams and Applications to 2-Wasserstein Approximation
Organizations: CNRS and Sorbonne Université
Abstract
This paper introduces the Sierpiński-Knopp (SK) Wasserstein distance, a fast metric between persistence diagrams. The SK-Wasserstein distance, denoted , maps diagram points and their diagonal projections to the unit interval via the Sierpiński-Knopp space-filling curve on the upper diagonal triangle. The encoded point sets are then efficiently matched via one-dimensional optimal assignment, in steps, yielding an explicit diagonal-aware point assignment between the two input persistence diagrams. We show that the SK-Wasserstein distance controls the classical -Wasserstein distance between diagrams, admits an explicit isometric embedding into a Hilbert space, and induces a positive-definite Gaussian kernel, making the resulting geometry directly compatible with Euclidean and kernel-based learning methods. A tighter surrogate dissimilarity, noted , is also introduced based on the point assignments along the curve. Experiments on 12 scientific collections comprising 227 diagrams show median per-collection speedup of over state-of-the-art approximations of is , while the aggregate speedup over the full benchmark is . Average-linkage partitions obtained from and each exactly match the corresponding partition on 8 of the 12 collections. Hilbert -means and Gaussian spectral clustering, both based on , achieve mean adjusted Rand indices (ARI) of and , respectively, with respect to the benchmark reference partitions, compared to obtained by average linkage on . The Gaussian kernel supports other kernel-based analysis tasks, as illustrated by its use for contiguous segmentation of ordered diagram collections in our experiments.