cond-mat.mtrl-sciSep 13, 2026

Prescreening Point Defects in Semiconductors With Machine Learning

Authors: Paul Karlsson, Joel Davidsson, Rickard Armiento

Organizations: Department of Physics, Chemistry and Biology, Linköping University, Linköping, Sweden

Abstract

High-throughput calculations using density-functional theory (DFT) are commonly used to explore point defects for applications in power electronics and quantum technologies. There is currently a major shift away from these traditional simulation techniques towards machine learning (ML) methods. We explore a class of physics-guided ML models for predicting defect formation energies and zero-phonon lines (ZPL) to identify point defects for quantum applications. The models are specifically targeted for use in a prescreening step for accelerated high-throughput workflows, and are therefore designed to avoid the costly relaxation step typically present with ML interatomic potentials (MLIPs). We compare performance for single and double point defect systems in 4H-SiC with ridge, kernel ridge, and multilayer perceptron (MLP) models using three different descriptors representing the defect systems. For vacancies and substitutions, the optimized models give mean absolute errors (MAEs) of 0.437 eV for the formation energy and 0.202 eV for ZPLs, which is just above the level at which such predictions can be useful even beyond the targeted prescreening, i.e., in some applications they may completely replace the need for costly DFT calculations. For interstitials the MAEs are larger, 1.101 eV for the formation energy and 0.230 eV for the ZPL, which, while still useful for prescreening, will not generally be useful for more detailed characterization. Hence, while the results may be further improved by model design and optimization, the models presented in this work are already useful for prescreening in high-throughput characterization of point defects.

Explore similar work

Sep 28, 2025cs.LG

ADAPT: Lightweight, Long-Range Machine Learning Force Fields Without Graphs

Point defects play a central role in driving the properties of materials. First-principles methods are widely used to compute defect energetics and structures, including at scale for high-throughput defect databases. However, these methods are computationally expensive, making machine-learning force fields (MLFFs) an attractive alternative for accelerating structural relaxations. Most existing MLFFs are based on graph neural networks (GNNs), which can suffer from oversmoothing, oversquashing, and poor representation of long-range interactions. Both of these issues are especially of concern when modeling point defects. To address these challenges, we introduce the \textit{Accelerated Deep Atomic Potential Transformer} (ADAPT), an MLFF that replaces graph representations with a direct coordinates-in-space formulation and explicitly considers all pairwise atomic interactions. Atoms are treated as tokens, with a Transformer encoder modeling their interactions. Applied to a dataset of silicon point defects, ADAPT achieves a roughly 22% reduction in force and a roughly 40 percent reduction in energy prediction error relative to a state-of-the-art GNN-based model, while requiring only a fraction of the computational cost.
Evan Dramko, Yihuang Xiong, Yizhi Zhu +4
Sep 8, 2026cs.LG

MLIP Detective: Active Failure Mode Discovery Beyond Benchmark Scores for Machine-Learning Interatomic Potentials

Universal machine-learning interatomic potentials (u-MLIPs) aim to generalize across diverse configurations. Benchmarks enable reproducible evaluation but may not expose failures outside their predefined scope. Here, we show that physics-informed search can complement benchmark-based evaluation by uncovering hidden failure modes. We introduce MLIP Detective, an agentic framework for active failure mode discovery. Starting from benchmark evidence, MLIP Detective generates falsifiable, physics-informed failure hypotheses, screens them with inexpensive simulations, and escalates only the most suspicious cases to human experts together with proposed verification protocols. Without issue-specific prompting, MLIP Detective identified and characterized a systematic anomaly in MACE-MPA-0: the model predicted some relaxed adsorbate-surface systems involving O- or F-containing adsorbates to be higher in energy than their corresponding separated fragments. Using cross-model comparisons, MLIP Detective further inferred a likely training-data origin for the anomaly, consistent with recent reports.
Ryuhei Okuno, Nontawat Charoenphakdee, Kaoru Hisama +1
Jul 23, 2026cond-mat.mes-hall

Machine Learning for Charge State Characterization of Isolated Double Quantum Dots

Scaling semiconductor quantum dot arrays toward fault-tolerant quantum computing requires efficient tuneup of spin qubits, a process that depends on the analysis of charge stability maps (CSMs) and remains largely manual. While machine learning has been widely applied to CSM analysis in reservoir-coupled devices, automated tuning in the increasingly important isolated-mode regime has received limited attention. In isolated-mode CSMs, charge transitions appear as near-vertical lines, making them well suited to compact, task-specific models. We present two convolutional neural networks with fewer than one million parameters, trained on CSMs collected from 32 silicon metal-oxide-semiconductor (SiMOS) double-quantum-dot devices measured at approximately 1 K using an automated cryogenic probing system. Sixteen devices were used for training and sixteen were held out to evaluate cross-device generalization against hand-labeled ground truth. CSMClassifier identifies charge instability and sensor artifacts, achieving 94% macro-averaged accuracy across three quality classes on 2,407 held-out images. ChargeLineNet localizes charge-transition lines and determines electron occupancy, achieving 95.3% exact line-count accuracy on 1,131 held-out images. Combined into a single pipeline, the models correctly determine electron occupancy for 93.8% of clean held-out images. Pre-training on synthetic images substantially improves label efficiency. Fine-tuning the pre-trained model on limited experimental data maintains over 90% accuracy, whereas training from scratch degrades significantly under the same conditions. Together, the two models occupy only 6.5 MB and process images in less than 60 ms on standard laboratory hardware, demonstrating a practical path toward scalable, automated characterization and tuneup of quantum-dot devices.
Hyma Vallabhapurapu, Marco Candido, Krishna Choudhary +7