A Composable AI-Accelerated Iterative Solver for 3D-IC Thermal Modeling
Organizations: Cadence Design Systems · University of Notre Dame
Abstract
Accurate thermal analysis of heterogeneous 2.5D/3D-IC packages is essential yet computationally prohibitive. A single full-package FEM simulation can take hours, while AI-based surrogates treat the entire stack as a monolithic prediction target and must be retrained whenever the die count or topology changes. To address this limitation, this work proposes Domain-Decomposed AI-Accelerated Iterative Solver for Thermal Analysis (DAIST), a composable thermal solver that decomposes the global package simulation into block-level subdomain problems, replaces subdomain solvers with neural operators, and couples them through iterative exchanges of interfacial temperature and heat flux. This local-to-global architecture eliminates the topology lock-in of monolithic models: block-level neural operators can be directly reused in unseen package assemblies without retraining. The iterative coupling strategy further provides a controllable accuracy-runtime tradeoff, where the iteration budget can be adjusted to trade accuracy for runtime. Evaluated on a multi-chiplet system and an advanced packaging system, DAIST achieves up to speedup over traditional FEM solvers with mean temperature errors of 0.068% and 0.323%, respectively, while demonstrating cross-topology reuse of block-level models across structurally distinct package assemblies.
Figures & tables
| Block | Orientation | No. components | Footprint ‡ | Thickness ( m) † | (W/m K) † | Power (W) † ∗ |
|---|---|---|---|---|---|---|
| Case I: Multi-chiplet system (Interposer–SoC–HBM) | ||||||
| Interposer | face up | mm | ||||
| SoC | face down | mm | ||||
| HBM | face down | mm | ||||
| Case II: Advanced packaging system (Interposer–MC–TIM) | ||||||
| Interposer | face up | mm | ||||
| Method | MAE (K) | Max (K) | Runtime (s) | Speedup |
|---|---|---|---|---|
| Celsius reference | — | — | ||
| DAIST |
| Iterations | Mean MAE (K) | Wall time ∗ |
| Method | Test Set | Runtime (s) | MAE (K) | Max (K) | MAPE | RMSE (K) |
|---|---|---|---|---|---|---|
| DAIST | Fixed-topology | |||||
| Variable-topology | ||||||
| Monolithic | Fixed-topology | |||||
| Variable-topology |
| Block | Trained on | Tested in |
|---|---|---|
| Interposer | SoC–HBM (frozen) | MC–TIM |
| MC | MC–TIM | MC–TIM |
| TIM | MC–TIM | MC–TIM |
| Iterations | Mean MAE (K) | Wall time (s) |
| Celsius reference | — |