cs.CVMar 6, 2025

ISP-AD: A Large-Scale Real-World Dataset for Advancing Industrial Anomaly Detection with Synthetic and Real Defects

Authors: Paul J. KrassnigDieter P. Gruber

Abstract

Automatic visual inspection using machine learning plays a key role in achieving zero-defect policies in industry. Research on anomaly detection is constrained by the availability of datasets that capture complex defect appearances and imperfect imaging conditions, which are typical of production processes. Recent benchmarks indicate that most publicly available datasets are biased towards optimal imaging conditions, leading to an overestimation of their applicability in real-world industrial scenarios. To address this gap, we introduce the Industrial Screen Printing Anomaly Detection Dataset (ISP-AD). It presents challenging small and weakly contrasted surface defects embedded within structured patterns exhibiting high permitted design variability. To the best of our knowledge, it is the largest publicly available industrial dataset to date, including both synthetic and real defects collected directly from the factory floor. Beyond benchmarking recent unsupervised anomaly detection methods, experiments on a mixed supervised training strategy, incorporating both synthesized and real defects, were conducted. Experiments show that even a small amount of injected, weakly labeled real defects improves generalization. Furthermore, starting from training on purely synthetic defects, emerging real defective samples can be efficiently integrated into subsequent scalable training. Overall, our findings indicate that model-free synthetic defects can provide a cold-start baseline, whereas a small number of injected real defects refine the decision boundary for previously unseen defect characteristics. The presented unsupervised and supervised dataset splits are designed to emphasize research on unsupervised, self-supervised, and supervised approaches, enhancing their applicability to industrial settings.

Explore similar work

Apr 29, 2026cs.CV

SynSur: An end-to-end generative pipeline for synthetic industrial surface defect generation and detection

The bottleneck in learning-based industrial defect detection is often limited not by model capacity, but by the scarcity of labeled defect data: defects are rare, annotations are expensive, and collecting balanced training sets is slow. We present an end-to-end pipeline for synthetic defect generation and annotation, combining Vision-Language-Model-based prompts, LoRA-adapted diffusion, mask-guided inpainting, and sample filtering with automatic label derivation, and demonstrates the potential of real data with realistic synthetic samples to overcome data scarcity. The evaluation is conducted on, a challenging dataset of pitting defects on ball screw drives, and then on a subset of the Mobile phone screen surface defect segmentation dataset (MSD) dataset to test cross-domain transfer. Beyond downstream detector performance, we analyze key stages of the pipeline, including prompt construction, LoRA selection, and sample filtering with DreamSim and CLIPScore, to understand which synthetic samples are both realistic and useful. Experiments with YOLOv26, YOLOX, and LW-DETR show that synthetic-only training does not replace real data. When combined with real data, synthetic defects can preserve performance and yield modest gains in selected BSData training regimes. The MSD transfer study shows that the overall pipeline structure carries over to a second industrial inspection domain, while also highlighting the importance of domain-specific adaptation and annotation-quality control. Overall, the paper provides an end-to-end assessment of diffusion-based industrial defect synthesis and shows that its strongest value lies in strengthening scarce real datasets rather than substituting for them.
Paul Julius Kühn, Mika Pommeranz, Arjan Kuijper +1
May 8, 2026cs.CV

Real-IAD MVN: A Multi-View Normal Vector Dataset and Benchmark for High-Fidelity Industrial Anomaly Detection

Industrial Anomaly Detection (IAD) is critical for quality control, but existing methods struggle with subtle, geometric defects. Standard 2D (RGB) images are sensitive to texture and lighting but often miss fine geometric anomalies. While 3D point clouds capture macro-shape, they are typically too sparse to detect micro-defects like scratches or pits. We address this fundamental data limitation by introducing Real-IAD-MVN (Multi-View Normal), a large-scale industrial dataset. By upgrading our acquisition system, Real-IAD-MVN captures high-fidelity surface normal maps from five distinct viewpoints, replacing sparse 3D data entirely. This provides a comprehensive geometric representation at a micro-detail level, making previously invisible side-wall and occluded defects explicitly detectable. Our experiments, conducted on this new dataset, first provide evidence that incorporating dense, multi-view pseudo-3D (surface normals) yields significantly better detection performance than using sparse 3D point cloud data. To further validate the dataset and provide a strong benchmark, we introduce a baseline method based on reconstruction, which learns to extract cross-modal unified prototypes from the image and normal map streams. We demonstrate that this unified prototype approach surpasses existing state-of-the-art multimodal fusion methods, highlighting the rich potential of our new dataset for advancing geometric anomaly detection.
Wenbing Zhu, Jianing Liang, Linjie Cheng +7
Jul 31, 2026cs.CV

OSAGEN: Object-Aware Mask Priors and Multistage Decoupled Diffusion for Industrial Anomaly Generation

Industrial anomaly detection and localization are limited by scarce real anomalies and pixel-level annotations, a bottleneck that synthetic image-mask pairs can alleviate. However, existing few-shot mask-guided generation may over-follow mask geometry, produce weak anomalies, or use condition masks incompatible with the current object instance. We propose OSAGEN, which combines object-aware mask priors with multistage decoupled diffusion. Its three-stage adaptation sequentially learns normal appearance, defect appearance under coarse conditions, and fine-grained mask calibration, improving defect realization and local control. QBG injects object structure from a matched normal image into mask diffusion to produce object-aware priors, while ISC restricts anomaly propagation and preserves normal content during sampling. A lightweight materialization step recovers pixel-level labels aligned with the realized defects. On MVTec AD and VisA, OSAGEN achieves AP-P/F1-P scores of 88.1/82.2 and 68.5/66.1, respectively, under a unified downstream localization protocol. The code will be released upon acceptance.
Jinyi Xu, Peng Chen, Yunkang Cao +3