quant-phFeb 4, 2026

Instance-optimal high-precision shadow tomography with few-copy measurements: A metrological approach

Authors: Senrui Chen, Weiyuan Gong, Sisi Zhou

Organizations: IQIM, California Institute of Technology · SEAS, Harvard University · Perimeter Institute

Abstract

We study the sample complexity of shadow tomography in the high-precision regime under realistic measurement constraints. Given an unknown dd-dimensional quantum state ρρ and a known set of observables {Oi}i=1m\{O_i\}_{i=1}^m, the goal is to estimate expectation values {tr(Oiρ)}i=1m\{\mathrm{tr}(O_iρ)\}_{i=1}^m to accuracy εε in LpL_p-norm, using possibly adaptive measurements that act on O(polylog(d))O(\mathrm{polylog}(d)) number of copies of ρρ at a time. We focus on the regime where εε is below an instance-dependent threshold. Our main contribution is an instance-optimal characterization of the sample complexity as Θ~(Γp/ε2)\tildeΘ(Γ_p/ε^2), where ΓpΓ_p is a function of {Oi}i=1m\{O_i\}_{i=1}^m defined via an optimization formula involving the inverse Fisher information matrix. Previously, tight bounds were known only in special cases, e.g. Pauli shadow tomography with L∞L_\infty-norm error. Concretely, we first analyze a simpler oblivious variant where the goal is to estimate an observable of the form ∑i=1mαiOi\sum_{i=1}^m α_i O_i with ∥α∥q=1\|α\|_q = 1 (where qq is dual to pp) revealed after the measurement. For single-copy measurements, we obtain a sample complexity of Θ(Γpob/ε2)Θ(Γ^{\mathrm{ob}}_p/ε^2). We then show Θ~(Γp/ε2)\tildeΘ(Γ_p/ε^2) is necessary and sufficient for the original problem, with the lower bound applying to unbiased, bounded estimators. Our upper bounds rely on a two-step algorithm combining coarse tomography with local estimation. Notably, Γ∞ob=Γ∞Γ^{\mathrm{ob}}_\infty = Γ_\infty. In both cases, allowing cc-copy measurements improves the sample complexity by at most Ω(1/c)Ω(1/c). Our results establish a quantitative correspondence between quantum learning and metrology, unifying asymptotic metrological limits with finite-sample learning guarantees.

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