Artefact-Aware Fungal Detection in Dermatophytosis: A Real-Time Transformer-Based Approach for KOH Microscopy
Organizations: Department of Mechatronics Engineering, Yildiz Technical University · Division of Systems Medicine, Department of Metabolism, Digestion and Reproduction, Imperial College London · Department of Dermatology and Venereology, Istanbul Research and Training Hospital · Department of Bioengineering, Yildiz Technical University ·
Abstract
Dermatophytosis is commonly assessed using potassium hydroxide (KOH) microscopy, yet accurate recognition of fungal hyphae is hindered by artefacts, heterogeneous keratin clearance, and notable inter-observer variability. This study presents a transformer-based detection framework using the RT-DETR model architecture to achieve precise, query-driven localization of fungal structures in high-resolution KOH images. A dataset of 2,540 routinely acquired microscopy images was manually annotated using a multi-class strategy to explicitly distinguish fungal elements from confounding artefacts. The model was trained with morphology-preserving augmentations to maintain the structural integrity of thin hyphae. Evaluation on an independent test set demonstrated robust object-level performance, with a recall of 0.9737, precision of 0.8043, and an [email protected] of 93.56%. When aggregated for image-level diagnosis, the model achieved 100% sensitivity and 98.8% accuracy, correctly identifying all positive cases without missing a single diagnosis. Qualitative outputs confirmed the robust localization of low-contrast hyphae even in artefact-rich fields. These results highlight that an artificial intelligence (AI) system can serve as a highly reliable, automated screening tool, effectively bridging the gap between image-level analysis and clinical decision-making in dermatomycology.
Figures & tables
| Category | Component | Count / Value |
|---|---|---|
| Images | Total Microscopic Frames | 2,540 |
| Resolution | Pixel Dimensions | |
| Annotations | Fungal Elements (Positive Class) | 631 |
| Confounding Artefacts (Negative Class) | 381 |
| Evaluation Level | Metric | Value |
| Object-Level | Precision | 0.8043 |
| (Detection Performance) | Recall (Sensitivity) | 0.9737 |
| F1-Score | 0.8810 | |
| [email protected] (%) | 93.56 | |
| [email protected]:0.95 (%) | 78.40 | |
| Mean IoU | 0.8560 |
Microscopy Image Analysis
Microscopy image analysis uses computational methods to detect, segment, track, reconstruct, and quantify structures in scientific images.
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