Failure Detection in Chemical Processes Using Symbolic Machine Learning: A Case Study on Ethylene Oxidation
Organizations: Department of Computing, Imperial College London, London, United Kingdom · Department of Chemical and Biochemical Engineering, Technical University of Denmark, Kongens Lyngby, Denmark · ILASP Limited, London, United Kingdom
Abstract
Over the past decade, Artificial Intelligence has significantly advanced, mostly driven by large-scale neural approaches. However, in the chemical process industry, where safety is critical, these methods are often unsuitable due to their brittleness, and lack of explainability and interpretability. Furthermore, open-source real-world datasets containing historical failures are scarce in this domain. In this paper, we investigate an approach for predicting failures in chemical processes using symbolic machine learning and conduct a feasibility study in the context of an ethylene oxidation process. Our method builds on a state-of-the-art symbolic machine learning system capable of learning predictive models in the form of probabilistic rules from context-dependent noisy examples. This system is a general-purpose symbolic learner, which makes our approach independent of any specific chemical process. To address the lack of real-world failure data, we conduct our feasibility study leveraging data generated from a chemical process simulator. Experimental results show that symbolic machine learning can outperform baseline methods such as random forest and multilayer perceptron, while preserving interpretability through the generation of compact, rule-based predictive models. Finally, we explain how such learned rule-based models could be integrated into agents to assist chemical plant operators in decision-making during potential failures.
Figures & tables
| param | unit | default | min | max | instr |
|---|---|---|---|---|---|
| SRCR1.P | bar | 2 | 1.6 | 1.98 | uniform |
| SRCE1.P | bar | 2 | 1.95 | 2.05 | uniform |
| SRCR1.M[C2H4] | kmol | 4464 | 4240 | 4360 | uniform |
| Learning parameters | Accuracy | Interpretability | Confidence | |||
| Non-default assignments | ||||||
| (1) | 1 | 1 | 2.14 | 1.4 | 0.74 | |
| (2) | 0.82 | 0.92 | 3 | 1.33 | 0.55 | |
| (3) | 0.75 | 0.88 | 3 | 1.7 | 0.75 | |
| (4) | 0.7 | 0.85 | 3.11 | 1.8 | 0.73 | |
| (5) | 0.83 | 0.93 | 2.5 | 1 | 0.7 | |
| Config. | SVM | MLP | RF | HGB | AB | Ours |
|---|---|---|---|---|---|---|
| (1) | 0.95 | 0.95 | 0.97 | 0.97 | 0.97 | 1 |
| (2) | 0.85 | 0.83 | 0.87 | 0.89 | 0.87 | 0.92 |
| (3) | 0.84 | 0.77 | 0.85 | 0.84 | 0.85 | 0.88 |
| (14) | 0.87 | 0.86 | 0.97 | 0.97 | 0.97 | 0.94 |
| (15) | 0.85 | 0.83 | 0.87 | 0.89 | 0.87 | 0.92 |
| (16) | 0.83 | 0.82 | 0.89 | 0.89 | 0.87 | 0.9 |
Fault Detection
Fault detection identifies abnormal behavior in machines, sensors, infrastructure, software, and autonomous systems before it causes harm or disruption.
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