IoT-Enhanced CNN-Based Labelled Crack Detection for Additive Manufacturing Image Annotation in Industry 4.0

Mohsen Asghari Ilani; Yaser Mike Banad

cs.CVApr 22, 2026

IoT-Enhanced CNN-Based Labelled Crack Detection for Additive Manufacturing Image Annotation in Industry 4.0

Authors: Mohsen Asghari Ilani, Yaser Mike Banad

Organizations: School of Management, Swansea University, Swansea, United Kingdom · School of Electrical and Computer Engineering, University of Oklahoma, Norman, 73019, U.S.A.

Abstract

This paper presents an IoT-enhanced deep learning framework for automated crack detection in Additive Manufacturing (AM) surfaces using convolutional neural networks (CNNs). By integrating IoT-enabled real-time monitoring, high-resolution imaging, and edge computing, the system enables continuous in-situ defect detection and classification. Real-time data acquisition supports immediate CNN-based analysis, improving both accuracy and efficiency in AM quality control. The framework supports supervised and semi-supervised learning, enabling robust performance on large, sparsely annotated datasets. Using LabelImg for annotation and OpenCV for preprocessing, the system achieves 99.54% accuracy on 14,982 images, with 96% precision, 98% recall, and a 97% F1-score. Dataset balancing and augmentation significantly improve generalization, increasing accuracy from 32% to 99%. Beyond detection, the framework establishes a linkage between AM process parameters, defect formation, and surface topology, supporting predictive analytics and defect mitigation. Aligned with Industry 4.0, it incorporates Digital Twin (DT) technology for real-time process simulation, predictive maintenance, and adaptive control. Key contributions include an IoT-based monitoring system using edge devices (Raspberry Pi 4B), an optimized CNN with model quantization and batch processing reducing inference latency by 47%, and an MQTT-based low-latency data streaming system with 5G connectivity, lowering transmission overhead by 35%. DT integration further enables predictive defect analysis and dynamic adjustment of AM parameters. This work advances intelligent AM quality control by providing a scalable, high-accuracy, and low-latency framework. Future directions include multimodal data fusion, hybrid architectures, and enhanced Digital Twin simulations for AI-driven defect prevention.

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