ProGAN-Based Synthetic Image Generation for Industrial Visual Inspection of Metallic Parts

The bottleneck in learning-based industrial defect detection is often limited not by model capacity, but by the scarcity of labeled defect data: defects are rare, annotations are expensive, and collecting balanced training sets is slow. We present an end-to-end pipeline for synthetic defect generation and annotation, combining Vision-Language-Model-based prompts, LoRA-adapted diffusion, mask-guided inpainting, and sample filtering with automatic label derivation, and demonstrates the potential of real data with realistic synthetic samples to overcome data scarcity. The evaluation is conducted on, a challenging dataset of pitting defects on ball screw drives, and then on a subset of the Mobile phone screen surface defect segmentation dataset (MSD) dataset to test cross-domain transfer. Beyond downstream detector performance, we analyze key stages of the pipeline, including prompt construction, LoRA selection, and sample filtering with DreamSim and CLIPScore, to understand which synthetic samples are both realistic and useful. Experiments with YOLOv26, YOLOX, and LW-DETR show that synthetic-only training does not replace real data. When combined with real data, synthetic defects can preserve performance and yield modest gains in selected BSData training regimes. The MSD transfer study shows that the overall pipeline structure carries over to a second industrial inspection domain, while also highlighting the importance of domain-specific adaptation and annotation-quality control. Overall, the paper provides an end-to-end assessment of diffusion-based industrial defect synthesis and shows that its strongest value lies in strengthening scarce real datasets rather than substituting for them.

Industrial visual inspection systems often suffer from a severe scarcity of labeled defect data, particularly during the early stages of New Product Introduction (NPI). This limitation hinders the deployment of robust supervised detectors precisely when automated quality control is most needed. We present an end-to-end generative framework for high-fidelity, few-shot defect synthesis that enables both in-domain augmentation and cross-domain transfer. Our approach disentangles defect morphology from background appearance by combining masked textual inversion for defect representation learning, noise-blended conditioned generation for surface-aware synthesis, and gradient-aware post-processing for seamless visual integration. We evaluate the framework in two practically relevant settings: few-shot data augmentation, where synthetic samples enrich a small set of real defects, and zero-shot adaptation, where defects learned from a source domain are transferred to a novel target surface without any real target-domain defect examples. Using RF-DETR as the downstream detector, we show that the proposed pipeline substantially narrows the domain gap on a private industrial dataset. In the few-shot setting, synthetic augmentation improves mAP from 78.8% to 83.3%. In the zero-shot setting, synthetic domain adaptation improves mAP from 65.0% to 85.1%. These results demonstrate that high-fidelity defect synthesis can meaningfully accelerate NPI by enabling effective inspection models before sufficient real defect data has been collected.

Industrial visual anomaly detection (VAD) methods are typically trained on normal samples only, yet performance improves substantially when even limited anomalous data is available. Existing anomaly generation approaches either require real anomalous examples, demand expensive hardware, or produce synthetic defects that lack realism. We present MIRAGE (Model-agnostic Industrial Realistic Anomaly Generation and Evaluation), a fully automated pipeline for realistic anomalous image generation and pixel-level mask creation that requires no training and no anomalous images. Our pipeline accesses any generative model as a black box via API calls, uses a VLM for automatic defect prompt generation, and includes a CLIP-based quality filter to retain only well-aligned generated images. For mask generation at scale, we introduce a lightweight, training-free dual-branch semantic change detection module combining text-conditioned Grounding DINO features with fine-grained YOLOv26-Seg structural features. We benchmark four generation methods using Gemini 2.5 Flash Image (Nano Banana) as the generative backbone, evaluating performance on MVTec AD and VisA across two distinct tasks: (i) downstream anomaly segmentation and (ii) visual quality of the generated images, assessed via standard metrics (IS, IC-LPIPS) and a human perceptual study involving 31 participants and 1,550 pairwise votes. The results demonstrate that MIRAGE offers a scalable, accessible foundation for anomaly-aware industrial inspection that requires no real defect data. As a final contribution, we publicly release a large-scale dataset comprising 500 image-mask pairs per category for every MVTec AD and VisA class, over 13,000 pairs in total, alongside all generation prompts and pipeline code.