Single-Photon Avalanche Diode

We present the first language-model-driven agentic artificial intelligence (AI) system to autonomously execute multi-stage physics experiments on a production synchrotron light source. Implemented at the Advanced Light Source particle accelerator, the system translates natural language user prompts into structured execution plans that combine archive data retrieval, control-system channel resolution, automated script generation, controlled machine interaction, and analysis. In a representative machine physics task, we show that preparation time was reduced by two orders of magnitude relative to manual scripting even for a system expert, while operator-standard safety constraints were strictly upheld. Core architectural features, plan-first orchestration, bounded tool access, and dynamic capability selection, enable transparent, auditable execution with fully reproducible artifacts. These results establish a blueprint for the safe integration of agentic AI into accelerator experiments and demanding machine physics studies, as well as routine operations, with direct portability across accelerators worldwide and, more broadly, to other large-scale scientific infrastructures.

Depth foundation models (DFMs) offer strong learned priors for 3D perception from single RGB images but lack physical depth cues, leading to ambiguities in metric scale. We introduce metalenses, an emerging class of ultrathin planar optical elements, as a solution to physically encode missing metric depth cues via nanophotonics. In this paper, we bridge the gap between metalens and DFMs to achieve accurate metric monocular depth sensing. In a single monocular shot, our metalens embeds depth-dependent positional shifts into two polarized optical wavefronts. With an input adaptation strategty, we enable direct fine-tuning that aligns a pretrained DFM with the optical signals. To scale the training data, we further develop a comprehensive simulation pipeline that synthesizes metalens responses from RGB-D datasets, incorporating physical factors to minimize the sim-to-real gap. Experiments demonstrate that this approach outperforms both monocular metric depth estimation and depth-from-defocus baselines, showing an effective pathway for accurate monocular metric depth sensing.

Ptychographic imaging at synchrotron and X-ray free-electron laser sources requires densely overlapping scans, which limits throughput and increases dose; extending coherent diffractive imaging to overlap-free operation on extended samples remains an open problem. We present a self-supervised inverse-mapping network for single-frame Fresnel coherent diffraction imaging (CDI) and overlapped ptychography with fixed, pre-estimated probes. The learned neural network reconstructs individual object patches from either one diffraction frame or several overlapping measurements at a time. In single-frame mode, the phase diversity provided by the curved-wavefront probe at the off-focus sample position removes the requirement for overlap constraints, enabling sparser scans and proportionally lower dose at fixed exposure. On synthetic line patterns, reconstructed amplitude SSIM exceeds 0.90 in single-frame mode with the curved probe and reaches 0.952-0.968 with overlap constraints. Optimization of the network via a Poisson negative log likelihood objective, rather than the more common mean absolute error, yields 10-fold improved photon-dose efficiency at doses below $10^5$ photons per image, where shot noise typically limits resolution. In addition to these synthetic studies, we demonstrate robust single-frame reconstruction of extended samples using ptychographic datasets from APS and LCLS, with end-to-end reconstruction of a 10,304-frame workload approximately $36\times$ faster than a highly optimized iterative solver. Together, these results unify single-frame Fresnel CDI and overlapped ptychography within one self-supervised framework, supporting dose-efficient, high-throughput imaging at modern light sources.