Prototype-Based Classification
Overview
Prototype-based classification represents each class with one or more examples, centers, or learned patterns, then predicts by measuring similarity in a feature space. Methods range from nearest-centroid and episodic few-shot learning to learned part prototypes, contrastive alignment, and geometric or distributional models; many use pretrained encoders when labeled data are scarce. The approach is used for few-shot recognition, continual learning, medical and time-series classification, and open-set or out-of-distribution detection, with evaluations spanning settings such as ImageNet-LT, CIFAR, and UEA/UCR time-series benchmarks. A central challenge is that prototypes can become unrepresentative under class variation, imbalance, or domain shift, while improving their interpretability and reliability may trade off against accuracy or depend strongly on the similarity and rejection rules used.
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