Cross-Scenario Industrial Defect Detection via Domain-Robust Training and Metric-Aligned Selection
Organizations: School of Artificial Intelligence, Guangzhou University, Guangzhou 510006, China
Abstract
Automated defect detection of industrial boards must remain highly reliable under cross-scenario variations in lighting, surface contaminants, and production line conditions. This makes cross-scenario defect detection a domain generalization problem, wherein models are required to detect, localize, and classify defects across unseen scenarios while minimizing false alarms on clean boards. For the IDA 2026 Track 1 challenge, we propose a cross-scenario defect detection method that includes four complementary modules: cross-scenario robust training, small-defect-aware learning, score calibration and inference threshold selection, and metric-aligned checkpoint selection. These four modules respectively introduce cross-scenario robust normalization and DSU-style statistic perturbation with progressive random convolution, NWD and parameter-free spatial attention, the VFL learning objective, and a custom SWAD variant driven by the Track 1-oriented proxy. Experimental results demonstrate that our model achieves a Track 1 score of 0.564 with a screening score of 0.696 on the test dataset on a single RTX 4090 GPU. The code is available at https://github.com/GZHU-DVL/Dikai.
Figures & tables
| Evaluation | ||||
|---|---|---|---|---|
| Local official | 0.826 | 0.436 | 0.543 | 0.596 |
| Challenge test feedback | 0.489 | 0.465 | 0.696 | 0.564 |
| (local official test) |
| Variant | ||||
|---|---|---|---|---|
| Short schedule (600 ep.) | ||||
| Full recipe | 0.819 | 0.451 | 0.629 | 0.632 |
| no MixRand | 0.818 | 0.450 | 0.624 | 0.630 |
| MixRand, no attenuation | 0.821 | 0.453 | 0.622 | 0.631 |
| no SWAD avg. | 0.817 | 0.428 | 0.602 | 0.614 |
| 2000-ep queried reference (local re-eval.) | ||||
Industrial Anomaly Detection
Industrial anomaly detection finds defective products and abnormal equipment behavior from visual, sensor, audio, and other production data.
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