Fault Detection and Bit-Error Rate Diagnostics in Optical Wireless Links Using Edge-AI
Organizations: Department of Electronics and Computer Engineering Pulchowk Campus, Institute of Engineering, Tribhuvan University Lalitpur, Nepal
Abstract
Optical Wireless Communication (OWC) systems provide high-bandwidth, spatially secure, and RF-interference-free digital transmission. However, direct free-space optical links suffer from extreme sensitivity to line-of-sight disruptions, optical attenuation, high ambient light saturation, and transmitter-receiver misalignment. Traditional channel diagnostic frameworks rely on external computing nodes or cloud-based processing, which introduces severe diagnostic latency and reduces edge node autonomy. This paper presents an autonomous, self-diagnosing optical wireless receiver node that integrates physical-layer signal telemetry extraction with an on-device TinyML classification engine. Built around an ESP32-S3 microcontroller, the receiver recovers 1000 bit/s On-Off Keying (OOK) digital payloads using a 5-sample majority voting mechanism while concurrently extracting real-time channel features: Bit Error Rate (BER), received signal voltage (Vsignal), Signal-to-Noise Ratio (SNRdB), and ambient light baseline (Lambient). Evaluated against a Random Forest baseline (77.22% accuracy) and a floating-point neural network (78.48% accuracy), a post-training INT8 quantized TensorFlow Lite Micro model occupying only 3.32 kB of SRAM runs directly on the receiver firmware. The quantized model achieves 74.68% overall accuracy across four distinct operational conditions: normal transmission, optical filter attenuation, ambient light interference, and severe obstruction/misalignment. On-device deployment tests confirm real-time, deterministic fault classification, establishing a practical approach for self-aware optical IoT nodes.
Figures & tables
| Model Architecture | Test Acc. (%) | RAM Footprint | Deployment Target |
|---|---|---|---|
| Random Forest Baseline | 77.22% | N/A | Host PC / Cloud |
| FP32 Neural Network | 78.48% | Desktop Simulation | |
| Quantized INT8 TFLite | 74.68% | 3.32 kB | ESP32-S3 (On-Device) |
| Diagnostic Class | Precision | Recall | F1-Score |
|---|---|---|---|
| Class 0 (Normal) | 0.94 | 1.00 | 0.97 |
| Class 1 (Optical Filter) | 0.69 | 0.91 | 0.78 |
| Class 2 (High Ambient) | 1.00 | 1.00 | 1.00 |
| Class 3 (Severe Obstruction) | 0.71 | 0.26 | 0.38 |
Fault Diagnosis
Fault diagnosis identifies, localizes, and explains failures in engineered and computational systems using sensor data, logs, models, and domain knowledge.
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