cs.LGNov 4, 2026

Cross-Asset Knowledge Transfer for Early Fault Detection of Data-Scarce Assets Without Target Fault Data

Authors: Zekai Wang, Yuxuan Li, Zhangyue Shi

Organizations: Charles F. Dolan School of Business, Fairfield University, Fairfield, CT, United States · School of Economics and Management, Tiangong University, Tianjin, China · Independent Researcher, Chesterfield, MO, United States

Abstract

Reliability management of industrial fleets depends on early fault warnings, yet lifecycle data across similar assets are highly imbalanced. A few assets accumulate run-to-failure histories, while newly installed or rarely failing assets provide only normal-condition data. This paper asks how diagnostic knowledge can be transferred from a data-rich source asset to a data-scarce target asset when no fault data have been observed on the target. We formulate cross-asset early fault detection as a zero-shot domain adaptation problem, in which zero-shot refers to the absence of target fault samples, and propose a framework that requires only normal data from the target. The framework comprises (1) a statistical process control step that labels the source asset run-to-failure data with an exponentially weighted moving average chart, reducing manual annotation to verifying flagged segments, (2) an Adapted Domain-Adversarial Neural Network (ADANN) that combines domain-adversarial training and a Maximum Mean Discrepancy penalty with an Adapted Classification-Domain (ACD) loss, which anchors the classifier normal region to the target own normal data, and (3) an ahead-of-time labeling scheme with a prediction horizon that targets incipient faults. Under an exact-classification assumption, a theoretical analysis characterizes the domain-adversarial term for a normal-only target and the alignment state in which source fault features remain separated from target normal features. On a public run-to-failure bearing dataset, ADANN attains the highest mean F1-score among four transfer baselines, with a nominally significant precision gain over the strongest baseline, and its robustness is examined under synthetic noise.

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