Scenario Approach with Post-Design Certification of User-Specified Properties
Authors: Algo Carè, Marco C. Campi, Simone Garatti
Organizations: Department of Information Engineering - University of Brescia, via Branze 38, 25123 Brescia, Italia · Dipartimento di Elettronica, Informazione e Bioingegneria - Politecnico di Milano, piazza Leonardo da Vinci 32, 20133 Milano, Italia
The scenario approach is an established data-driven design framework that comes equipped with a powerful theory linking design complexity to generalization properties. In this approach, data are simultaneously used both for design and for certifying the design's reliability, without resorting to a separate test dataset. This paper takes a step further by guaranteeing additional properties, useful in post-design usage but not considered during the design phase. To this end, we introduce a two-level framework of appropriateness: baseline appropriateness, which guides the design process, and post-design appropriateness, which serves as a criterion for a posteriori evaluation. We provide distribution-free upper bounds on the risk of failing to meet the post-design appropriateness; these bounds are computable without using any additional test data. Under additional assumptions, lower bounds are also derived. As part of an effort to demonstrate the usefulness of the proposed methodology, the paper presents two practical examples in H2 and pole-placement problems. Moreover, a method is provided to infer comprehensive distributional knowledge of relevant performance indexes from the available dataset.
Figures & tables
Fig. 1: Feedback configuration for the pole placement problem.
Fig. 2: A classic pendulum
Fig. 3: Locations in the complex plane of the closed-loop system poles corresponding to the N=2000 scenarios in problem ( 17 ). The dotted line is the border of the desired conic sector S−0.7,0.5 . The black dots in −1±j and −3±3j are the poles of the reference polynomial.
Fig. 4: Fϵ(ℓ−hN∗) and Fϵ(ℓ−hN∗) (solid lines) vs. actual cumulative distribution function of ∥η(T)∥∞ (dashed lines) for ρ=1 (top) and ρ=0.05 (bottom).
Dipartimento di Elettronica Informazione e Ingegneria, Politecnico di Milano, Milano, Italy · Dipartimento di Ingegneria dell’Informazione, Universit`a degli studi di Brescia, Brescia, Italy