AI for Science with GPT-6 Astra: Thermal Design and Electrothermal Analysis of 2D CFET
Authors: Min-Hui Kim, Khushi Sharma, Sarah Zhang, Ye Wang
Organizations: Graduate School of Semiconductor Materials and Devices, Ulsan National Institute of Science and Technology (UNIST), Ulsan 44919, Republic of Korea · Materials Science and Engineering, National University of Singapore, Singapore · Materials Science and Engineering, Cornell University, Ithaca, NY, USA · Department of Applied Physics and Science Education, Technische Universiteit Eindhoven, Eindhoven, The Netherlands
Thermal optimization of 2D CFET inverters requires testing structural proposals against their electrical costs. We examine these research tasks using an AI agent workflow within a supplied electrothermal model. At 12 nm, Astra selects a redistributed source-interconnect geometry, while a coordinating agent proposes a substrate-directed heat-removal path. The combined design reduces peak temperature rise by 1.67 K at fixed metal volume and 20 μW. A subsequent metal-resistance sensitivity gives about 0.6-K inverter cooling alongside a 2% nFET on-current loss. Effective contact-length scaling further shows that lower temperature can accompany higher thermal resistance when current falls. Reproduction identifies agreeing implementations and retains a 104.95-K failure for diagnosis. These results show that an AI scientist workflow can propose thermal structures, test them under common constraints, and quantify their electrical cost.
Figures & tables
Fig. 1: Agent workflow within a supplied model. Astra plans the interconnect search; the coordinating agent interprets the trend and proposes the via extension. Tool calls execute the tests; separate reruns check code consistency.
Fig. 2: Thermal design and electrical cost. (a) Selected device at 20 μ W, Pn/Pp=2 , Rcm=5 m 2 K/GW. At Lg=12 nm, (b) upper width varies at fixed metal volume or fixed lower width; (c) effective contact length varies. Changes are relative to wn=wp=8 nm, Lc=20 nm. Rth,peak uses fixed 20 μ W; self-heated Ion,n includes metal resistance at VGS=VDS=0.7 V.
Fig. 3: DC inverter response without metal resistance at VDD=0.7 V. (a) Voltage transfer characteristics, (b) DC power and (c) peak lattice temperature for baseline interconnects. Colors denote gate length; solid curves include self-heating, dashed curves are isothermal at 300 K. (d) Selected 12-nm device sections at y=0 under two static biases, with a common temperature scale and emphasized channels.
Structure
ΔTmax (K)
Reduction (K)
Baseline
141.63
0.00
Redistributed interconnect
140.75
0.88
Substrate-directed path
140.83
0.80
Combined
139.96
1.67
TABLE I: Thermal performance of design stages on a common mesh
Model / effort label
eT (K)
eC (pp)
Status
GPT-6 / Light a
0 (ref.)
0 (ref.)
Reference
GPT-6 Astra / Ultra b
1.34e-12
3.20e-13
Pass
Claude Fable 5.1 / high
4.26e-13
2.42e-13
Pass
Claude Opus 5 / high (A)
4.98e-10
2.88e-10
Pass
Claude Opus 5 (B)
4.26e-13
2.42e-13
Pass
GPT-5.6 Sol / max
4.98e-10
2.88e-10
Pass
TABLE II: Cross-agent reproduction of the fixed thermal reference cases
Parameter
GPT study
Claude baseline → C4
Sheets per tier (total)
4 (8)
1 (2)
Lg,Lh,W (nm)
12, 16, 40
20, 30, 50
tn,tp (nm)
0.65, 0.70
0.65, 0.65
Gate dielectric (nm)
1
3 (HfO 2 )
Within-tier gap (nm)
6
Not applicable
Inter-tier gap (nm)
20
26
TABLE III: Device parameters for the two design studies