This paper introduces the Sierpiński-Knopp (SK) Wasserstein distance, a fast metric between persistence diagrams. The SK-Wasserstein distance, denoted
dSK, maps diagram points and their diagonal projections to the unit interval via the Sierpiński-Knopp space-filling curve on the upper diagonal triangle. The encoded point sets are then efficiently matched via one-dimensional optimal assignment, in
O(NlogN) steps, yielding an explicit diagonal-aware point assignment between the two input persistence diagrams. We show that the SK-Wasserstein distance controls the classical
2-Wasserstein distance between diagrams, admits an explicit isometric embedding into a Hilbert space, and induces a positive-definite Gaussian kernel, making the resulting geometry directly compatible with Euclidean and kernel-based learning methods. A tighter surrogate dissimilarity, noted
WΓ, is also introduced based on the point assignments along the curve. Experiments on 12 scientific collections comprising 227 diagrams show median per-collection speedup of
dSK over state-of-the-art approximations of
W2 is
626×, while the aggregate speedup over the full benchmark is
2100×. Average-linkage partitions obtained from
dSK and
WΓ each exactly match the corresponding
W2 partition on 8 of the 12 collections. Hilbert
k-means and Gaussian spectral clustering, both based on
dSK, achieve mean adjusted Rand indices (ARI) of
0.756 and
0.800, respectively, with respect to the benchmark reference partitions, compared to
0.750 obtained by average linkage on
W2. The Gaussian
dSK kernel supports other kernel-based analysis tasks, as illustrated by its use for contiguous segmentation of ordered diagram collections in our experiments.