Scanning Transmission Electron Microscopy

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18 papers1 paper in the last four weeks, down 67% on the four weeks before. 0.0% of all new papers.

  1. Real-Time Atomic-Resolution Electron Phase Imaging without Probe Calibration via Ptychography-Supervised Learning

    Sep 22, 2026H. Yue, C. -C. Chen, C. -N. Hsiao +4Supervised LearningElectron Microscopy

    College of Intelligent Robotics and Advanced Manufacturing, Fudan University, Shanghai 200433, China. · Department of Engineering and System Science, National Tsing Hua University, Hsinchu 300044, Taiwan · National Center for Instrumentation Research, National Institutes of Applied Research, Hsinchu 300092, Taiwan +3

  2. A benchmark dataset and baseline methods for four-dimensional STEM diffraction patterns

    Sep 18, 2026Yuyan Guan, Haoran Zhang, Zian Mao +7Scanning Transmission Electron MicroscopyMicroscopy Image Analysis

    Global Institute of Future Technology, Shanghai Jiao Tong University, Shanghai 200240, China · Global College, Shanghai Jiao Tong University, Shanghai 200240, China · Contemporary Amperex Technology Co., Ltd., Ningde, P.R. China +1

  3. 4DMulti: automated multicomponent identification at complex material interfaces

    Sep 13, 2026Haoran Zhang, Zian Mao, Shufen Chu +6Image ClassificationComputational Materials Science

    Global Institute of Future Technology, Shanghai Jiao Tong University, 200240, Shanghai, China. · Global College, Shanghai Jiao Tong University, 200240, Shanghai, China. · School of Materials Science and Engineering, Shanghai Jiao Tong University, 200240, Shanghai, China.

  4. Zero-Shot Cross-Material Ptychographic Phase Reconstruction Using Deep Learning

    Sep 12, 2026Wen-Chun Lin, Yu-Chee Tseng, Jen-Jee Chen +1Image ReconstructionScanning Transmission Electron Microscopy

    Institute of Computational Intelligence, College of Artificial Intelligence, National Yang Ming Chiao Tung University, Taiwan · National Center for High-performance Computing, National Institutes of Applied Research, Taiwan

  5. Toward Optimal Adenovirus Detection Using YOLO26

    Jul 20, 2026Olivier RukundoData AugmentationObject Detection

    Department of Electronic and Computer Engineering; University of Limerick; Limerick, Ireland

  6. Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection

    Jul 19, 2026Shaoliang Yang, Jun WangIndustrial InspectionScanning Transmission Electron Microscopy

    Santa Clara University Santa Clara, CA 95053, USA

  7. Mapping Order in Semicrystalline Polymers using Machine Learning of Nanobeam Electron Diffraction

    Jul 18, 2026Nicholas Marchese, Arthur R. C. McCray, Yael Tsarfati +4Materials ScienceElectron Microscopy

    Department of Materials Science and Engineering, Stanford University, 496 Lomita Mall, Stanford, CA 94305, USA · SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, CA 94025, USA · National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, CA 94720, USA

  8. STEMGym: Benchmarking Sequential Decision-Making under Dose Budgets in Autonomous Electron Microscopy

    Jun 28, 2026Can Polat, Erchin Serpedin, Mustafa Kurban +1Scanning Transmission Electron MicroscopyAutonomous Experimentation

    Dept. of Electrical & Computer Eng. Texas A&M Univ. College Station, TX, USA · Dept. of Prosthetics & Orthotics College of Science & Eng. Ankara Univ., Ankara, Turkey · Hamad Bin Khalifa Univ. and Texas A&M Univ. at Qatar Doha, Qatar

  9. Unsupervised Deep Learning for Limited-Angle STEM-EDX Tomography -- Application to 3D Chemical Analysis of Phase-Change Memory Devices

    Jun 9, 2026Daniel del Pozo Bueno, Serge Brosset, Theo Monniez +3Deep Image PriorImage Reconstruction

    1CEA, LETI, Univ. Grenoble Alpes, Grenoble, 38000, France. · 2CEA, Neurospin, Paris-Saclay University, Gif-sur-Yvette, F-91191, France. · 3Inria, MIND, Palaiseau, F-91210, France.

  10. Context-Aware Deep Learning for Defect Classification in Atomic-Resolution STEM

    Jun 8, 2026Jiadong Dan, Cheng Zhang, Leyi Loh +5Materials ScienceMultimodal Classification

    Department of Biological Sciences, National University of Singapore, Singapore · Centre for BioImaging Sciences (CBIS), National University of Singapore, Singapore · Department of Materials Science and Engineering, City University of Hong Kong, China +5

  11. Improving Combined Detection and Classification of TEM Defects via Mask-Conditioned Latent Diffusion Augmentation

    Jun 1, 2026Ni Li, Nuohao Liu, Ryan Jacobs +5Synthetic Data AugmentationLatent Diffusion Models

    University of Wisconsin-Madison, Madison, WI · University of Michigan-Ann Arbor, Ann Arbor, MI

  12. Low-Magnification SEM May Suffice: Interpretable Deep Learning for Multi-Scale Fracture-Cause Classification in Zirconia-Toughened Alumina

    May 28, 2026Julian Schmid, Pawel Astankow, Tom Vater +3Materials ScienceExplainable Image Classification

    CeramTec GmbH, CeramTec-Platz 1–9, 73207 Plochingen, Germany · CeramTec

  13. Contrastive Image-Metadata Pre-Training for Materials Transmission Electron Microscopy

    Apr 27, 2026Georgia Channing, Debora Keller, Marta D. Rossell +3Cross-Modal AlignmentMultimodal Contrastive Learning

    Hugging Face · University of Oxford · Empa Dübendorf +1

  14. 3D Gaussian Splatting for Annular Dark Field Scanning Transmission Electron Microscopy Tomography Reconstruction

    Apr 6, 2026Beiyuan Zhang, Hesong Li, Ruiwen Shao +1Scanning Transmission Electron MicroscopyComputed Tomography

    Beijing Institute of Technology

  15. AI-assisted Human-in-the-Loop Web Platform for Structural Characterization in Hard drive design

    Apr 1, 2026Utkarsh Pratiush, Huaixun Huyan, Maryam Zahiri Azar +4Microscopy Image AnalysisScientific Workflow Automation

    Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN 37996, USA · Western Digital corporation, 5601 Great Oaks Parkway, San Jose, CA 95119, USA

  16. Statistical Characteristic-Guided Denoising for Rapid High-Resolution Transmission Electron Microscopy Imaging

    Mar 19, 2026Hesong Li, Ziqi Wu, Ruiwen Shao +1Scanning Transmission Electron MicroscopyImage Denoising

    Beijing Institute of Technology

  17. Novelty-Driven Target-Space Discovery in Automated Electron and Scanning Probe Microscopy

    Mar 17, 2026Utkarsh Pratiush, Kamyar Barakati, Boris N. Slautin +4Deep Kernel LearningScanning Transmission Electron Microscopy

    Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN 37996, USA · Department of Chemistry, University of Washington, Seattle, WA 98195, USA · Pacific Northwest National Laboratory, Richland, WA 99354, USA

  18. Bridging the Simulation-to-Reality Gap in Electron Microscope Calibration via VAE-EM Estimation

    Mar 17, 2026Jilles S. van Hulst, W. P. M. H. Heemels, Duarte J. AntunesElectron MicroscopyScanning Transmission Electron Microscopy

    The authors are with the Control Systems Technology Section, Department of Mechanical Engineering, Eindhoven University of Technology, 5600 MB Eindhoven, The Netherlands.